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Handbook of Nanoscopy.
This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the opticalto the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before goingon to cover the materia...
| Clasificación: | Libro Electrónico |
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| Otros Autores: | , , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Wiley-VCH
2012.
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| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Further Reading; Title Page; Copyright; Contents to Volume 1; Preface; List of Contributors; The Past, the Present, and the Future of Nanoscopy; The Past; The Present and the Future; Acknowledgments; References; Part I: Methods; Chapter 1: Transmission Electron Microscopy; 1.1 Introduction; 1.2 The Instrument; 1.3 Imaging and Diffraction Modes; 1.4 Dynamical Diffraction Theory; References; Chapter 2: Atomic Resolution Electron Microscopy; 2.1 Introduction; 2.2 Principles of Linear Image Formation; 2.3 Imaging in the Electron Microscope; 2.4 Experimental HREM; 2.5 Quantitative HREM.
- 2.6 Appendix 2.A: Interaction of the Electron with a Thin Object2.7 Appendix 2.B: Multislice Method; 2.8 Appendix 2.C: Quantum Mechanical Approach; References; Chapter 3: Ultrahigh-Resolution Transmission Electron Microscopy at Negative Spherical Aberration; 3.1 Introduction; 3.2 The Principles of Atomic-Resolution Imaging; 3.3 Inversion of the Imaging Process; 3.4 Case Study: SrTiO3; 3.5 Practical Examples of Application of NCSI Imaging; References; Chapter 4: Z-Contrast Imaging; 4.1 Recent Progress; 4.2 Introduction to the Instrument; 4.3 Imaging in the STEM; 4.4 Future Outlook.
- AcknowledgmentsReferences; Chapter 5: Electron Holography; 5.1 General Idea; 5.2 Image-Plane Off-Axis Holography Using the Electron Biprism; 5.3 Properties of the Reconstructed Wave; 5.4 Holographic Investigations; 5.5 Special Techniques; 5.6 Summary; Acknowledgments; References; Books; Articles; Basics; Method; Interpretation; Inverse Problem; Applications; Electric Potentials; Semiconductors; Li-Ion Batteries; Holographic Tomography; Magnetic; Atomic Resolution; Chapter 6: Lorentz Microscopy and Electron Holography of Magnetic Materials; 6.1 Introduction; 6.2 Lorentz Microscopy.
- 6.3 Off-Axis Electron Holography6.4 Discussion and Conclusions; Acknowledgments; References; Chapter 7: Electron Tomography; 7.1 History and Background; 7.2 Theory of Tomography; 7.3 Electron Tomography, Missing Wedge, and Imaging Modes; 7.4 STEM Tomography and Applications; 7.5 Hollow-Cone DF Tomography; 7.6 Diffraction Contrast Tomography; 7.7 Electron Holographic Tomography; 7.8 Inelastic Electron Tomography; 7.9 Advanced Reconstruction Techniques; 7.10 Quantification and Atomic Resolution Tomography; Acknowledgments; References.
- Chapter 8: Statistical Parameter Estimation Theory
- A Tool for Quantitative Electron Microscopy8.1 Introduction; 8.2 Methodology; 8.3 Electron Microscopy Applications; 8.4 Conclusions; Acknowledgments; References; Chapter 9: Dynamic Transmission Electron Microscopy; 9.1 Introduction; 9.2 Time-Resolved Studies Using Electrons; 9.3 Building a DTEM; 9.4 Applications of DTEM; 9.5 Future Developments for DTEM; 9.6 Conclusions; Acknowledgments; References; Chapter 10: Transmission Electron Microscopy as Nanolab; 10.1 TEM and Measuring the Electrical Properties; 10.2 TEM with MEMS-Based Heaters.