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Handbook of Nanoscopy.
This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the opticalto the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before goingon to cover the materia...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | , , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Wiley-VCH
2012.
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| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 245 | 0 | 0 | |a Handbook of Nanoscopy. |
| 260 | |b Wiley-VCH |c 2012. | ||
| 300 | |a 1 online resource (1449 pages) | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
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| 505 | 0 | |a Further Reading; Title Page; Copyright; Contents to Volume 1; Preface; List of Contributors; The Past, the Present, and the Future of Nanoscopy; The Past; The Present and the Future; Acknowledgments; References; Part I: Methods; Chapter 1: Transmission Electron Microscopy; 1.1 Introduction; 1.2 The Instrument; 1.3 Imaging and Diffraction Modes; 1.4 Dynamical Diffraction Theory; References; Chapter 2: Atomic Resolution Electron Microscopy; 2.1 Introduction; 2.2 Principles of Linear Image Formation; 2.3 Imaging in the Electron Microscope; 2.4 Experimental HREM; 2.5 Quantitative HREM. | |
| 505 | 8 | |a 2.6 Appendix 2.A: Interaction of the Electron with a Thin Object2.7 Appendix 2.B: Multislice Method; 2.8 Appendix 2.C: Quantum Mechanical Approach; References; Chapter 3: Ultrahigh-Resolution Transmission Electron Microscopy at Negative Spherical Aberration; 3.1 Introduction; 3.2 The Principles of Atomic-Resolution Imaging; 3.3 Inversion of the Imaging Process; 3.4 Case Study: SrTiO3; 3.5 Practical Examples of Application of NCSI Imaging; References; Chapter 4: Z-Contrast Imaging; 4.1 Recent Progress; 4.2 Introduction to the Instrument; 4.3 Imaging in the STEM; 4.4 Future Outlook. | |
| 505 | 8 | |a AcknowledgmentsReferences; Chapter 5: Electron Holography; 5.1 General Idea; 5.2 Image-Plane Off-Axis Holography Using the Electron Biprism; 5.3 Properties of the Reconstructed Wave; 5.4 Holographic Investigations; 5.5 Special Techniques; 5.6 Summary; Acknowledgments; References; Books; Articles; Basics; Method; Interpretation; Inverse Problem; Applications; Electric Potentials; Semiconductors; Li-Ion Batteries; Holographic Tomography; Magnetic; Atomic Resolution; Chapter 6: Lorentz Microscopy and Electron Holography of Magnetic Materials; 6.1 Introduction; 6.2 Lorentz Microscopy. | |
| 505 | 8 | |a 6.3 Off-Axis Electron Holography6.4 Discussion and Conclusions; Acknowledgments; References; Chapter 7: Electron Tomography; 7.1 History and Background; 7.2 Theory of Tomography; 7.3 Electron Tomography, Missing Wedge, and Imaging Modes; 7.4 STEM Tomography and Applications; 7.5 Hollow-Cone DF Tomography; 7.6 Diffraction Contrast Tomography; 7.7 Electron Holographic Tomography; 7.8 Inelastic Electron Tomography; 7.9 Advanced Reconstruction Techniques; 7.10 Quantification and Atomic Resolution Tomography; Acknowledgments; References. | |
| 505 | 8 | |a Chapter 8: Statistical Parameter Estimation Theory -- A Tool for Quantitative Electron Microscopy8.1 Introduction; 8.2 Methodology; 8.3 Electron Microscopy Applications; 8.4 Conclusions; Acknowledgments; References; Chapter 9: Dynamic Transmission Electron Microscopy; 9.1 Introduction; 9.2 Time-Resolved Studies Using Electrons; 9.3 Building a DTEM; 9.4 Applications of DTEM; 9.5 Future Developments for DTEM; 9.6 Conclusions; Acknowledgments; References; Chapter 10: Transmission Electron Microscopy as Nanolab; 10.1 TEM and Measuring the Electrical Properties; 10.2 TEM with MEMS-Based Heaters. | |
| 504 | |a Includes bibliographical references and index. | ||
| 520 | |a This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the opticalto the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before goingon to cover the materials class by class, analyzing how the different imaging methods can be successfully applied. It covers the latest developments in techniques, such as in-situ TEM, 3D imaging in TEM and SEM, as well as a broad range of material types, including metals, alloys, ceramics, polymers, semiconduc. | ||
| 590 | |a ProQuest Ebook Central |b Ebook Central Academic Complete | ||
| 650 | 0 | |a Microscopy. | |
| 650 | 0 | |a Nanotechnology. | |
| 650 | 6 | |a Microscopie. | |
| 650 | 6 | |a Nanotechnologie. | |
| 650 | 7 | |a microscopy. |2 aat | |
| 650 | 7 | |a Microscopy |2 fast | |
| 650 | 7 | |a Nanotechnology |2 fast | |
| 700 | 1 | |a Van Tendeloo, Gustaaf. |4 edt | |
| 700 | 1 | |a Van Dyck, Dirk. |4 edt | |
| 700 | 1 | |a Pennycook, Stephen J. |4 edt | |
| 776 | 0 | 8 | |i Print version: |t Handbook of Nanoscopy. |d Wiley-VCH 2012 |w (DLC) 2012418090 |
| 856 | 4 | 0 | |u https://ebookcentral.uam.elogim.com/lib/uam-ebooks/detail.action?docID=1037163 |z Texto completo |
| 938 | |a EBL - Ebook Library |b EBLB |n EBL4042288 | ||
| 938 | |a EBL - Ebook Library |b EBLB |n EBL1037163 | ||
| 938 | |a ProQuest MyiLibrary Digital eBook Collection |b IDEB |n 395664 | ||
| 994 | |a 92 |b IZTAP | ||