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Atomic force microscopy : understanding basic modes and advanced applications /
"This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration,...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Hoboken, New Jersey :
John Wiley & Sons, Inc.,
2012.
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| Edición: | First edition. |
| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Overview of AFM
- Distance-dependent interactions
- Z-dependent force measurements with AFM
- Topographic imaging
- Probing material properties I: phase imaging
- Probing material properties II: adhesive nanomechanics and mapping distance-dependent interactions
- Probing material properties III: lateral force methods
- Data post-processing and statistical analysis
- Spectral methods for measuring the normal cantilever spring constant K
- Derivation of Van der Waals force-distance expressions
- Derivation of energy dissipation expression, relationship to phase
- Relationships in meniscus geometry, circular approximation.