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Atomic force microscopy : understanding basic modes and advanced applications /
"This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration,...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Hoboken, New Jersey :
John Wiley & Sons, Inc.,
2012.
|
| Edición: | First edition. |
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 082 | 0 | 4 | |a 620/.5 |2 23 |
| 049 | |a UAMI | ||
| 100 | 1 | |a Haugstad, Greg, |d 1963- |e author. |1 https://id.oclc.org/worldcat/entity/E39PCjBypKThj67kJHrtxB979C | |
| 245 | 1 | 0 | |a Atomic force microscopy : |b understanding basic modes and advanced applications / |c Greg Haugstad. |
| 250 | |a First edition. | ||
| 264 | 1 | |a Hoboken, New Jersey : |b John Wiley & Sons, Inc., |c 2012. | |
| 264 | 4 | |c ©2012 | |
| 300 | |a 1 online resource (xxii, 464 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 500 | |a Edition statement from first page of chapter PDFs. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 520 | |a "This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions"--Publisher's description. | ||
| 505 | 0 | |a Overview of AFM -- Distance-dependent interactions -- Z-dependent force measurements with AFM -- Topographic imaging -- Probing material properties I: phase imaging -- Probing material properties II: adhesive nanomechanics and mapping distance-dependent interactions -- Probing material properties III: lateral force methods -- Data post-processing and statistical analysis -- Spectral methods for measuring the normal cantilever spring constant K -- Derivation of Van der Waals force-distance expressions -- Derivation of energy dissipation expression, relationship to phase -- Relationships in meniscus geometry, circular approximation. | |
| 588 | 0 | |a Print version record. | |
| 590 | |a ProQuest Ebook Central |b Ebook Central Academic Complete | ||
| 650 | 0 | |a Atomic force microscopy. | |
| 650 | 6 | |a Microscopie à force atomique. | |
| 650 | 7 | |a SCIENCE |x Nanoscience. |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Nanotechnology & MEMS. |2 bisacsh | |
| 650 | 7 | |a Atomic force microscopy |2 fast | |
| 650 | 7 | |a Rasterkraftmikroskopie |2 gnd | |
| 758 | |i has work: |a Atomic force microscopy (Text) |1 https://id.oclc.org/worldcat/entity/E39PCGrbCVRQYwCgpDdYBvHy8d |4 https://id.oclc.org/worldcat/ontology/hasWork | ||
| 776 | 0 | 8 | |i Print version: |a Haugstad, Greg, 1963- |t Atomic force microscopy. |d Hoboken, N.J. : John Wiley & Sons, [2012] |z 9780470638828 |w (DLC) 2012003429 |w (OCoLC)682892479 |
| 856 | 4 | 0 | |u https://ebookcentral.uam.elogim.com/lib/uam-ebooks/detail.action?docID=894402 |z Texto completo |
| 880 | 8 | |6 505-00/(S |a 5.3.2. Fixed A/A0 Imaging -- 5.3.3. Variable A/A0 via Z-Dependent Point Measurements -- 5.4. Virial Interpretation of Phase -- 5.5. Caveats and Data Analysis Strategies when Quantitatively Interpreting Phase Data -- References -- 6. Probing Material Properties II: Adhesive Nanomechanics and Mapping Distance-Dependent Interactions -- 6.1. General Concepts and Interrelationships -- 6.2. Adhesive Contact Mechanics Models -- 6.2.1. Overview and Disclaimers -- 6.2.2. JKR and DMT Models -- 6.2.3. Ranging Between JKR and DMT: The Transition Parameter λ -- 6.2.4. The Maugis-Dugdale Model -- 6.2.5. Other Formal Relationships Relevant to Adhesive Contact Mechanics -- 6.2.6. Summary Comments and Caveats on Adhesive Contact Mechanics Models -- 6.3. Capillarity, Details of Meniscus Force -- 6.3.1. Framing the Issues -- 6.3.2. Basic Elements of Modeling the Meniscus -- 6.3.3. Mathematics of Meniscus Geometry and Force -- 6.3.4. Experimental Examples of Capillarity -- 6.3.5. Capillary Transfer Phenomena: Difficulties and Opportunities -- 6.4. Approach-Retract Curve Mapping -- 6.4.1. Motivation and Background -- 6.4.2. Traditional Force-Curve Mapping -- 6.4.3. Approach-Retract Curve Mapping in Dynamic AFM -- 6.4.4. Approach-Retract Curve Mapping of Liquidy Domains in Complex Thin Films -- 6.5. High-Speed/Full Site Density Force-Curve Mapping and Imaging -- 6.5.1. Liquidy Domains in Complex Thin Films -- 6.5.2. PBMA/PLMA Blend at Variable Ultimate Load -- 6.5.3. PBMA/Dexamethasone Mixture at Variable Temperature -- 6.5.4. Arborescent Styrene-Isobutylene-Styrene Block Copolymer Plus Drug Rapamycin -- 6.5.5. Comments on "Force Modulation" Mode -- References -- 7. Probing Material Properties III: Lateral Force Methods -- 7.1. Components of Lateral Force Signal -- 7.2. Application of Lateral Force Difference -- 7.3. Calibration of Lateral Force. | |
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