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Atomic force microscopy : understanding basic modes and advanced applications /
"This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration,...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Hoboken, New Jersey :
John Wiley & Sons, Inc.,
2012.
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| Edición: | First edition. |
| Temas: | |
| Acceso en línea: | Texto completo |
| Sumario: | "This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions"--Publisher's description. |
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| Notas: | Edition statement from first page of chapter PDFs. |
| Descripción Física: | 1 online resource (xxii, 464 pages) : illustrations |
| Bibliografía: | Includes bibliographical references and index. |
| ISBN: | 9781118360668 1118360664 9781118360699 1118360699 9781283646024 1283646021 9786613958525 6613958522 |