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Defects-recognition imaging and physics in semiconductors XIV : selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan /
This volume documents the latest understanding of many topics of current interest in the science and technology of defects in semiconductors. The investigation of defects in semiconductors is a little different to that in other fields of materials science: in order to observe defects in semiconducto...
| Clasificación: | Libro Electrónico |
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| Autor Corporativo: | |
| Otros Autores: | , |
| Formato: | Electrónico Congresos, conferencias eBook |
| Idioma: | Inglés |
| Publicado: |
Durnten-Zurich ; Enfield, N.H. :
Trans Tech Publications,
©2012.
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| Colección: | Materials science forum ;
v. 725. |
| Temas: | |
| Acceso en línea: | Texto completo |
| Sumario: | This volume documents the latest understanding of many topics of current interest in the science and technology of defects in semiconductors. The investigation of defects in semiconductors is a little different to that in other fields of materials science: in order to observe defects in semiconductors and elucidate their physical nature, a very wide range of tools and techniques has been introduced or created; thanks to the inventive ideas of the researchers. This work clearly reflects the lively state of defect investigation in semiconductors. Review from Book News Inc.: Drawn from papers del. |
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| Descripción Física: | 1 online resource (xiii, 299 pages) : illustrations |
| Bibliografía: | Includes bibliographical references and author index. |
| ISBN: | 9783038138563 3038138568 |
| ISSN: | 0255-5476 ; |