Semiconductor Strain Metrology : Principles and Applications.
This book surveys the major and newly developed techniques for semiconductor strain metrology. This e-book employs a tutorial approach to explain the principles and applications of each technique specifically tailored for graduate students and postdoctoral researchers.
Clasificación: | Libro Electrónico |
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Autor principal: | Wong, Terence K. S. |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Sharjah :
Bentham Science Publishers,
2012.
|
Temas: | |
Acceso en línea: | Texto completo |
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