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Optical imaging and metrology : advanced technologies /

A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leadin...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Osten, Wolfgang, Reingand, Nadya
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Weinheim : Chichester : Wiley-VCH ; John Wiley [distributor], 2012.
Temas:
Acceso en línea:Texto completo
Descripción
Sumario:A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.
Descripción Física:1 online resource : color illustrations
Bibliografía:Includes bibliographical references and index.
ISBN:9783527648474
352764847X
9783527648467
3527648461
9783527648450
3527648453
9783527648443
3527648445
9781280782824
128078282X