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Recent Topics on Modeling of Semiconductor Processes, Devices, and Circuits.
The last couple of years have been very busy for the semiconductor industry and researchers. The rapid speed of production channel length reduction has brought lithographic challenges to semiconductor modeling. These include stress optimization, transistor reliability and efficient circuit design wi...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Sharjah :
Bentham Science Publishers,
2011.
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| Temas: | |
| Acceso en línea: | Texto completo |
| Sumario: | The last couple of years have been very busy for the semiconductor industry and researchers. The rapid speed of production channel length reduction has brought lithographic challenges to semiconductor modeling. These include stress optimization, transistor reliability and efficient circuit design with respect to interconnects, power and leakage at the chip level. This e-book focuses on the latest semiconductor techniques devised to address these issues. It should be a useful resource for electronic engineers and semiconductor chip designers. |
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| Descripción Física: | 1 online resource (200 pages) |
| ISBN: | 9781608050741 1608050742 |