Advanced interconnects for ULSI technology /
"This book presents an in-depth overview of present status, novel developments and new materials and approaches for advanced interconnect technology"--
Clasificación: | Libro Electrónico |
---|---|
Otros Autores: | Baklanov, Mikhail, Ho, P. S., Zschech, Ehrenfried |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Hoboken, NJ :
Wiley,
2012.
|
Temas: | |
Acceso en línea: | Texto completo |
Ejemplares similares
-
Electromigration in ULSI interconnections /
por: Tan, Cher Ming, 1959-
Publicado: (2010) -
Electromigration in ULSI interconnections /
por: Tan, Cher Ming, 1959-
Publicado: (2010) -
Crystal growth and evaluation of silicon for VLSI and ULSI /
por: Eranna, G.
Publicado: (2015) -
VLSI test principles and architectures : design for testability /
Publicado: (2006) -
VLSI test principles and architectures : design for testability /
Publicado: (2006)