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00000cam a2200000 a 4500 |
001 |
EBOOKCENTRAL_ocn773039086 |
003 |
OCoLC |
005 |
20240329122006.0 |
006 |
m o d |
007 |
cr cnu---unuuu |
008 |
120117s2012 enka ob 001 0 eng d |
040 |
|
|
|a N$T
|b eng
|e pn
|c N$T
|d YDXCP
|d E7B
|d UIU
|d UPM
|d KNOVL
|d DEBSZ
|d OCLCQ
|d ZCU
|d CAMBR
|d KNOVL
|d OCLCF
|d KNOVL
|d EBLCP
|d COO
|d IDEBK
|d OCLCQ
|d D6H
|d STF
|d OCLCQ
|d BUF
|d UAB
|d OCLCQ
|d COCUF
|d CEF
|d CUY
|d MERUC
|d RRP
|d ICG
|d K6U
|d LOA
|d VT2
|d U3W
|d OCLCQ
|d WYU
|d LVT
|d DKC
|d OCLCQ
|d ERF
|d OCLCQ
|d UKCRE
|d MM9
|d OCLCQ
|d UKAHL
|d OCLCO
|d S2H
|d OCLCO
|d OCLCQ
|d OCLCO
|d INARC
|d OCLCL
|d OCLCQ
|
019 |
|
|
|a 763159195
|a 765127834
|a 769266024
|a 816873473
|a 819631147
|a 1042942578
|a 1043674533
|a 1065851754
|a 1076629998
|a 1081229934
|a 1153469179
|
020 |
|
|
|a 9781139161268
|q (electronic bk.)
|
020 |
|
|
|a 1139161261
|q (electronic bk.)
|
020 |
|
|
|a 9781139014960
|q (electronic bk.)
|
020 |
|
|
|a 113901496X
|q (electronic bk.)
|
020 |
|
|
|a 1139157442
|q (electronic bk.)
|
020 |
|
|
|a 9781139157445
|q (electronic bk.)
|
020 |
|
|
|a 9781139154659
|q (electronic bk.)
|
020 |
|
|
|a 1139154656
|q (electronic bk.)
|
020 |
|
|
|a 9781139159210
|
020 |
|
|
|a 1139159216
|
020 |
|
|
|a 1283342359
|
020 |
|
|
|a 9781283342353
|
020 |
|
|
|z 9780521762106
|
020 |
|
|
|z 0521762103
|
024 |
8 |
|
|a 9786613342355
|
029 |
1 |
|
|a AU@
|b 000048846742
|
029 |
1 |
|
|a AU@
|b 000049789553
|
029 |
1 |
|
|a DEBSZ
|b 371512255
|
029 |
1 |
|
|a DEBSZ
|b 431063818
|
029 |
1 |
|
|a DEBSZ
|b 445985941
|
029 |
1 |
|
|a NZ1
|b 14691002
|
029 |
1 |
|
|a NZ1
|b 15622160
|
035 |
|
|
|a (OCoLC)773039086
|z (OCoLC)763159195
|z (OCoLC)765127834
|z (OCoLC)769266024
|z (OCoLC)816873473
|z (OCoLC)819631147
|z (OCoLC)1042942578
|z (OCoLC)1043674533
|z (OCoLC)1065851754
|z (OCoLC)1076629998
|z (OCoLC)1081229934
|z (OCoLC)1153469179
|
050 |
|
4 |
|a TK7871.9
|b .N66 2012eb
|
072 |
|
7 |
|a TEC
|x 008110
|2 bisacsh
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072 |
|
7 |
|a TJ
|2 bicssc
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082 |
0 |
4 |
|a 621.3815/28
|2 23
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|a UAMI
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|a Nonlinear transistor model parameter extraction techniques /
|c edited by Matthias Rudolph, Christian Fager, David E. Root.
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|a Cambridge, UK ;
|a New York :
|b Cambridge University Press,
|c 2012.
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|a 1 online resource (xiv, 352 pages) :
|b illustrations
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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|a data file
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|a The Cambridge RF and microwave engineering series
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|a Includes bibliographical references and index.
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|a Print version record.
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|a Cover; Nonlinear Transistor Model Parameter Extraction Techniques; The Cambridge RF and Microwave Engineering Series; Title; Copyright; Contents; List of contributors; Preface; 1 Introduction; 1.1 Model extraction challenges; 1.1.1 Accuracy; 1.1.1.1 Circuit application; 1.1.1.2 Measurement uncertainty; 1.1.1.3 Process variations; 1.1.2 Numerical convergence; 1.1.2.1 Breakdown; 1.1.2.2 Self-heating; 1.1.3 Choice of the modeling transistor; 1.2 Model extraction workflow; References; 2 DC and thermal modeling: III -- V FETs and HBTs; 2.1 Introduction; 2.2 Basic DC characteristics.
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|a 2.3 FET DC parameters and modeling2.4 HBT DC parameters and modeling; 2.5 Process control monitoring; 2.6 Thermal modeling overview; 2.7 Physics-based thermal scaling model for HBTs; 2.8 Measurement-based thermal model for FETs; 2.9 Transistor reliability evaluation; Acknowledgments; References; 3 Extrinsic parameter and parasitic elements in III -- V HBT and HEMT modeling; 3.1 Introduction; 3.2 Test structures with calibration and de-embedding; 3.3 Methods for extrinsic parameter extraction used in HBTs; 3.3.1 Equivalent circuit topology.
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|a 3.3.2 Physical description of contact resistances and overlap capacitances3.3.3 Extrinsic resistance and inductance extraction; 3.4 Methods for extrinsic parameter extraction used in HEMTs; 3.4.1 Cold FET technique; 3.4.2 Unbiased technique; 3.4.3 GaN HEMTs exceptions; 3.5 Scaling for multicell arrays; References; 4 Uncertainties in small-signal equivalent circuit modeling; 4.1 Introduction; 4.1.1 Sources of uncertainty in modeling; 4.1.2 Measurement uncertainty; 4.2 Uncertainties in direct extraction methods; 4.2.1 Simple direct extraction example; 4.2.1.1 Example circuit and measurements.
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|a 4.2.1.2 Uncertainty analysis4.2.1.3 Parameter estimation; 4.2.1.4 Parameter correlations; 4.2.2 Results using transistor measurements; 4.2.2.1 Uncertainty contributions; 4.2.2.2 Intrinsic model parameter sensitivities; 4.2.2.3 Intrinsic model parameter uncertainties; 4.2.2.4 Multibias extraction results; 4.3 Optimizer-based estimation techniques; 4.3.1 Maximum likelihood estimation; 4.3.1.1 Simple example; 4.3.1.2 MLE uncertainty; 4.3.2 MLE of small-signal transistor model parameters; 4.3.2.1 Parasitic parameter estimation; 4.3.2.2 Application to parasitic FET model extraction.
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|a 4.3.2.3 MLE of intrinsic model parameters4.3.2.4 Application to intrinsic FET model extraction; 4.3.3 Comparison between MLE and the direct extraction method; 4.3.4 Application of MLE in RF-CMOS de-embedding; 4.3.4.1 Method description; 4.3.4.2 Example using 130 nm RF-CMOS measurements; 4.3.4.3 Comparison between different de-embedding methods; 4.3.5 Discussion; 4.4 Complexity versus uncertainty in equivalent circuit modeling; 4.4.1 Finding an optimum model topology; 4.4.2 An illustrative example; 4.4.2.1 MSE estimation procedure; 4.4.2.2 Results; 4.5 Summary and discussion; References.
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|a Achieve accurate and reliable parameter extraction using a broad range of techniques and models provided.
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|a Knovel
|b ACADEMIC - Aerospace & Radar Technology
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|a ProQuest Ebook Central
|b Ebook Central Academic Complete
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|a Transistors
|x Mathematical models.
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|a Electronic circuit design.
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|a Transistors
|x Modèles mathématiques.
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|a Circuits électroniques
|x Calcul.
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|a TECHNOLOGY & ENGINEERING
|x Electronics
|x Transistors.
|2 bisacsh
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|a Electronic circuit design
|2 fast
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|a Transistors
|x Mathematical models
|2 fast
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|a Rudolph, Matthias,
|d 1969-
|1 https://id.oclc.org/worldcat/entity/E39PCjGJffMrBXFmhgwRPMVqDC
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|a Fager, Christian.
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|a Root, David E.
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|i Print version:
|t Nonlinear transistor model parameter extraction techniques.
|d Cambridge, UK ; New York : Cambridge University Press, 2012
|z 9780521762106
|w (DLC) 2011027239
|w (OCoLC)721888726
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830 |
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|a Cambridge RF and microwave engineering series.
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856 |
4 |
0 |
|u https://ebookcentral.uam.elogim.com/lib/uam-ebooks/detail.action?docID=807153
|z Texto completo
|
938 |
|
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|a Internet Archive
|b INAR
|n isbn_9780521762106
|
938 |
|
|
|a Askews and Holts Library Services
|b ASKH
|n AH16077718
|
938 |
|
|
|a EBL - Ebook Library
|b EBLB
|n EBL807153
|
938 |
|
|
|a ebrary
|b EBRY
|n ebr10514175
|
938 |
|
|
|a EBSCOhost
|b EBSC
|n 408971
|
938 |
|
|
|a ProQuest MyiLibrary Digital eBook Collection
|b IDEB
|n 334235
|
938 |
|
|
|a YBP Library Services
|b YANK
|n 7266400
|
938 |
|
|
|a YBP Library Services
|b YANK
|n 7273218
|
938 |
|
|
|a YBP Library Services
|b YANK
|n 7408069
|
938 |
|
|
|a YBP Library Services
|b YANK
|n 7236380
|
994 |
|
|
|a 92
|b IZTAP
|