Mechanical stress on the nanoscale : simulation, material systems and characterization techniques /

A comprehensive overview of the current level of stress engineering on the nanoscale combining the theoretical fundamentals with simulation methods, model systems and characterization techniques.

Bibliographic Details
Call Number:Libro Electrónico
Other Authors: Hanbücken, Margrit, Muller, Pierre, 1950-, Wehrspohn, Ralf B.
Format: Electronic eBook
Language:Inglés
Published: Weinheim : Wiley-VCH, 2011.
Subjects:
Semiconductors > Defects.
Semiconductors > Reliability.
Semi-conducteurs > Défauts.
Semi-conducteurs > Fiabilité.
TECHNOLOGY & ENGINEERING > Material Science.
Semiconductors > Defects
Semiconductors > Reliability
Online Access:Texto completo
Table of Contents:
  • pt. 1. Fundamentals of stress and strain on the nanoscale
  • pt. 2. Model systems with stress-engineered properties
  • pt. 3. Characterization techniques of measuring stresses on the nanoscale.

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