Mechanical stress on the nanoscale : simulation, material systems and characterization techniques /

A comprehensive overview of the current level of stress engineering on the nanoscale combining the theoretical fundamentals with simulation methods, model systems and characterization techniques.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Hanbücken, Margrit, Muller, Pierre, 1950-, Wehrspohn, Ralf B.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Weinheim : Wiley-VCH, 2011.
Temas:
Semiconductors > Defects.
Semiconductors > Reliability.
Semi-conducteurs > Défauts.
Semi-conducteurs > Fiabilité.
TECHNOLOGY & ENGINEERING > Material Science.
Semiconductors > Defects
Semiconductors > Reliability
Acceso en línea:Texto completo
Tabla de Contenidos:
  • pt. 1. Fundamentals of stress and strain on the nanoscale
  • pt. 2. Model systems with stress-engineered properties
  • pt. 3. Characterization techniques of measuring stresses on the nanoscale.

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