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|a Mechanical stress on the nanoscale :
|b simulation, material systems and characterization techniques /
|c edited by Margrit Hanbücken, Pierre Muller, Ralf B. Wehrspohn.
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260 |
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|a Weinheim :
|b Wiley-VCH,
|c 2011.
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300 |
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|a 1 online resource (380 pages)
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336 |
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|a text
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|a Print version record.
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|a pt. 1. Fundamentals of stress and strain on the nanoscale -- pt. 2. Model systems with stress-engineered properties -- pt. 3. Characterization techniques of measuring stresses on the nanoscale.
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504 |
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|a Includes bibliographical references and index.
|
520 |
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|a A comprehensive overview of the current level of stress engineering on the nanoscale combining the theoretical fundamentals with simulation methods, model systems and characterization techniques.
|
590 |
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|a ProQuest Ebook Central
|b Ebook Central Academic Complete
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650 |
|
0 |
|a Semiconductors
|x Defects.
|
650 |
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0 |
|a Semiconductors
|x Reliability.
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650 |
|
6 |
|a Semi-conducteurs
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|a Semi-conducteurs
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|a TECHNOLOGY & ENGINEERING
|x Material Science.
|2 bisacsh
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650 |
|
7 |
|a Semiconductors
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650 |
|
7 |
|a Semiconductors
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700 |
1 |
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|a Hanbücken, Margrit.
|
700 |
1 |
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|a Muller, Pierre,
|d 1950-
|1 https://id.oclc.org/worldcat/entity/E39PBJvxrDMRfbYd6vtdVpYHG3
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700 |
1 |
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|a Wehrspohn, Ralf B.
|
758 |
|
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|i has work:
|a Mechanical stress on the nanoscale (Text)
|1 https://id.oclc.org/worldcat/entity/E39PCFYMDxMr7rb9kmJJGg8Hmd
|4 https://id.oclc.org/worldcat/ontology/hasWork
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|z 9786613379498
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|z Texto completo
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