Aberration-corrected Analytical Electron Microscopy.

The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corre...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Wiley 2011.
Temas:
Transmission electron microscopy.
Aberration.
Achromatism.
Microscopie électronique à transmission.
Achromatisme.
Aberration
Achromatism
Transmission electron microscopy
Electronic resource.
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Aberration-Corrected Analytical Transmission Electron Microscopy
  • Contents
  • List of Contributors
  • Preface
  • 1 General Introduction to Transmission Electron Microscopy (TEM)
  • 1.1 What TEM Offers
  • 1.2 Electron Scattering
  • 1.2.1 Elastic Scattering
  • 1.2.2 Inelastic Scattering
  • 1.3 Signals which could be Collected
  • 1.4 Image Computing
  • 1.4.1 Image Processing
  • 1.4.2 Image Simulation
  • 1.5 Requirements of a Specimen
  • 1.6 STEM Versus CTEM
  • 1.7 Two Dimensional and Three Dimensional Information
  • 2 Introduction to Electron Optics
  • 2.1 Revision of Microscopy with Visible Light and Electrons2.2 Fresnel and Fraunhofer Diffraction
  • 2.3 Image Resolution
  • 2.4 Electron Lenses
  • 2.4.1 Electron Trajectories
  • 2.4.2 Aberrations
  • 2.5 Electron Sources
  • 2.6 Probe Forming Optics and Apertures
  • 2.7 SEM, TEM and STEM
  • 3 Development of STEM
  • 3.1 Introduction: Structural and Analytical Information in Electron Microscopy
  • 3.2 The Crewe Revolution: How STEM Solves the Information Problem
  • 3.3 Electron Optical Simplicity of STEM
  • 3.4 The Signal Freedom of STEM
  • 3.4.1 Bright-Field Detector (Phase Contrast, Diffraction Contrast)3.4.2 ADF, HAADF
  • 3.4.3 Nanodiffraction
  • 3.4.4 EELS
  • 3.4.5 EDX
  • 3.4.6 Other Techniques
  • 3.5 Beam Damage and Beam Writing
  • 3.6 Correction of Spherical Aberration
  • 3.7 What does the Future Hold?
  • 4 Lens Aberrations: Diagnosis and Correction
  • 4.1 Introduction
  • 4.2 Geometric Lens Aberrations and Their Classification
  • 4.3 Spherical Aberration-Correctors
  • 4.3.1 Quadrupole-Octupole Corrector
  • 4.3.2 Hexapole Corrector
  • 4.3.3 Parasitic Aberrations
  • 4.4 Getting Around Chromatic Aberrations4.5 Diagnosing Lens Aberrations
  • 4.5.1 Image-based Methods
  • 4.5.2 Ronchigram-based Methods
  • 4.5.3 Precision Needed
  • 4.6 Fifth Order Aberration-Correction
  • 4.7 Conclusions
  • 5 Theory and Simulations of STEM Imaging
  • 5.1 Introduction
  • 5.2 Z-Contrast Imaging of Single Atoms
  • 5.3 STEM Imaging Of Crystalline Materials
  • 5.3.1 Bright-field Imaging and Phase Contrast
  • 5.3.2 Annular Dark-field Imaging
  • 5.4 Incoherent Imaging with Dynamical Scattering
  • 5.5 Thermal Diffuse Scattering
  • 5.5.1 Approximations for Phonon Scattering5.6 Methods of Simulation for ADF Imaging
  • 5.6.1 Absorptive Potentials
  • 5.6.2 Frozen Phonon Approach
  • 5.7 Conclusions
  • 6 Details of STEM
  • 6.1 Signal to Noise Ratio and Some of its Implications
  • 6.2 The Relationships Between Probe Size, Probe Current and Probe Angle
  • 6.2.1 The Geometric Model Revisited
  • 6.2.2 The Minimum Probe Size, the Optimum Angle and the Probe Current
  • 6.2.3 The Probe Current
  • 6.2.4 A Simple Approximation to Wave Optical Probe Size
  • 6.2.5 The Effect of Chromatic Aberration

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