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An Engineer's Guide to Automated Testing of High-Speed Interfaces.

Providing a complete introduction to the state-of-the-art in high-speed digital testing with automated test equipment (ATE), this practical resource is the first book focus exclusively on this increasingly important topic. Featuring clear examples, this one-stop reference covers all critical aspects...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Moreira, Jose
Otros Autores: Werkmann, Hubert
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Norwood : Artech House, 2010.
Temas:
Acceso en línea:Texto completo

MARC

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245 1 3 |a An Engineer's Guide to Automated Testing of High-Speed Interfaces. 
260 |a Norwood :  |b Artech House,  |c 2010. 
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505 0 |a An Engineer's Guide to Automated Testing of High-Speed Interfaces; Contents; Preface; Acknowledgments; 1 Introduction; 2 High-Speed Digital BasicsThis; 3 High-Speed Interface Standards; 4 ATE Instrumentation for DigitalApplications; 5 Tests and Measurements; 6 Production Testing; 7 Support Instrumentation; 8 Test Fixture Design; 9 Advanced ATE Topics; A Introduction to the Gaussian Distribution and Analytical Computation of the BER; B The Dual Dirac Model and RJ/DJ Separation; C Pseudo-Random Bit Sequences and Other Data Patterns; D Coding, Scrambling, Disparity, and CRC. 
505 8 |a E Time Domain Reflectometry andTime Domain Transmission(TDR/TDT)F S-Parameters; G Engineering CAD Tools; H Test Fixture Evaluation andCharacterization; I Jitter Injection Calibration; About the Authors; Index. 
520 |a Providing a complete introduction to the state-of-the-art in high-speed digital testing with automated test equipment (ATE), this practical resource is the first book focus exclusively on this increasingly important topic. Featuring clear examples, this one-stop reference covers all critical aspects of the subject, from high-speed digital basics, ATE instrumentation for digital applications, and test and measurements, to production testing, support instrumentation and text fixture design. This in-depth volume also discusses at advanced ATE topics, such as multiplexing of ATE pin channels and t. 
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650 0 |a Automatic test equipment. 
650 0 |a Very high speed integrated circuits. 
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650 6 |a Circuits intégrés à très grande vitesse. 
650 7 |a Automatic test equipment  |2 fast 
650 7 |a Very high speed integrated circuits  |2 fast 
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