ESD : Failure Mechanisms and Models.

Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Voldman, Dr. Steven H.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Chichester : John Wiley & Sons, 2009.
Temas:
Semiconductors > Failures.
Integrated circuits > Protection.
Integrated circuits > Testing.
Integrated circuits > Reliability.
Electric discharges.
Electrostatics.
Electric action of points.
Semi-conducteurs > Défaillances.
Circuits intégrés > Protection.
Circuits intégrés > Fiabilité.
Décharges électriques.
Electric action of points
Electric discharges
Electrostatics
Integrated circuits > Protection
Integrated circuits > Reliability
Integrated circuits > Testing
Semiconductors > Failures
Acceso en línea:Texto completo
Tabla de Contenidos:
  • ESD Failure Mechanisms and Models; Contents; About the Author; Preface; Acknowledgments; 1 Failure Analysis and ESD; 2 Failure Analysis Tools, Models, and Physics of Failure; 3 CMOS Failure Mechanisms; 4 CMOS Circuits: Receivers and Off-Chip Drivers; 5 CMOS Integration; 6 SOI ESD Failure Mechanisms; 7 RF CMOS and ESD; 8 Micro-electromechanical Systems; 9 Gallium Arsenide; 10 Smart Power, LDMOS, and BCD Technology; 11 Magnetic Recording; 12 Photo-masks and Reticles: Failure Mechanisms; Index.

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