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ESD : Failure Mechanisms and Models.
Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Chichester :
John Wiley & Sons,
2009.
|
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 100 | 1 | |a Voldman, Dr. Steven H. | |
| 245 | 1 | 0 | |a ESD : |b Failure Mechanisms and Models. |
| 260 | |a Chichester : |b John Wiley & Sons, |c 2009. | ||
| 300 | |a 1 online resource (410 pages) | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 505 | 0 | |a ESD Failure Mechanisms and Models; Contents; About the Author; Preface; Acknowledgments; 1 Failure Analysis and ESD; 2 Failure Analysis Tools, Models, and Physics of Failure; 3 CMOS Failure Mechanisms; 4 CMOS Circuits: Receivers and Off-Chip Drivers; 5 CMOS Integration; 6 SOI ESD Failure Mechanisms; 7 RF CMOS and ESD; 8 Micro-electromechanical Systems; 9 Gallium Arsenide; 10 Smart Power, LDMOS, and BCD Technology; 11 Magnetic Recording; 12 Photo-masks and Reticles: Failure Mechanisms; Index. | |
| 520 | |a Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a failure analysis and case-study approach. It provides a clear insight into the physics of failure from a generalist perspective, followed by investigation of failure mechanisms in specific technologies, circuits, and systems. The book is unique in covering both the failure mechanism and the practical solutions to fix the problem from either a technology or circuit methodol. | ||
| 588 | 0 | |a Print version record. | |
| 590 | |a ProQuest Ebook Central |b Ebook Central Academic Complete | ||
| 650 | 0 | |a Semiconductors |x Failures. | |
| 650 | 0 | |a Integrated circuits |x Protection. | |
| 650 | 0 | |a Integrated circuits |x Testing. | |
| 650 | 0 | |a Integrated circuits |x Reliability. | |
| 650 | 0 | |a Electric discharges. | |
| 650 | 0 | |a Electrostatics. | |
| 650 | 0 | |a Electric action of points. | |
| 650 | 6 | |a Semi-conducteurs |x Défaillances. | |
| 650 | 6 | |a Circuits intégrés |x Protection. | |
| 650 | 6 | |a Circuits intégrés |x Fiabilité. | |
| 650 | 6 | |a Décharges électriques. | |
| 650 | 7 | |a Electric action of points |2 fast | |
| 650 | 7 | |a Electric discharges |2 fast | |
| 650 | 7 | |a Electrostatics |2 fast | |
| 650 | 7 | |a Integrated circuits |x Protection |2 fast | |
| 650 | 7 | |a Integrated circuits |x Reliability |2 fast | |
| 650 | 7 | |a Integrated circuits |x Testing |2 fast | |
| 650 | 7 | |a Semiconductors |x Failures |2 fast | |
| 758 | |i has work: |a ESD (Text) |1 https://id.oclc.org/worldcat/entity/E39PD38CbpQgfvrvCwyHbtbkym |4 https://id.oclc.org/worldcat/ontology/hasWork | ||
| 776 | 1 | |z 9780470511374 | |
| 856 | 4 | 0 | |u https://ebookcentral.uam.elogim.com/lib/uam-ebooks/detail.action?docID=454456 |z Texto completo |
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