Terrestrial neutron-induced soft errors in advanced memory devices /

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Détails bibliographiques
Cote:Libro Electrónico
Autres auteurs: Nakamura, Takashi, 1939-
Format: Électronique eBook
Langue:Inglés
Publié: Hackensack, NJ : World Scientific, ©2008.
Sujets:
Soft errors (Computer science)
Semiconductor storage devices.
Neutron irradiation.
Radiation dosimetry.
Nuclear physics.
Erreurs temporaires (Informatique)
Ordinateurs > Mémoires à semi-conducteurs.
Neutrons > Irradiation.
Dosimétrie.
Physique nucléaire.
dosimetry.
nuclear physics.
COMPUTERS > Machine Theory.
COMPUTERS > Computer Engineering.
COMPUTERS > Hardware > General.
Neutron irradiation
Nuclear physics
Radiation dosimetry
Semiconductor storage devices
Accès en ligne:Texto completo
Table des matières:
  • Introduction
  • Terrestrial neutron spectrometry and dosimetry
  • Irradiation testing in the terrestrial field
  • Neutron irradiation test facilities
  • Review and discussion of experimental data
  • Monte Carlo simulation methods
  • Simulation results and their implications
  • International standardization of the neutron test method
  • Summary and challenges.

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