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Terrestrial neutron-induced soft errors in advanced memory devices /

There are numerous elaborate and comprehensive textbooks and guidelines on stroke. However, busy clinicians are constantly bombarded with new knowledge for an infinite number of medical conditions. It becomes a challenge for them to tease out the important information that will help guide them throu...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Nakamura, Takashi, 1939-
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Hackensack, NJ : World Scientific, ©2008.
Temas:
Acceso en línea:Texto completo

MARC

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245 0 0 |a Terrestrial neutron-induced soft errors in advanced memory devices /  |c Takashi Nakamura [and others]. 
260 |a Hackensack, NJ :  |b World Scientific,  |c ©2008. 
300 |a 1 online resource (xxii, 343 pages) :  |b illustrations (some color) 
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504 |a Includes bibliographical references (pages 291-315) and index. 
505 0 |a Introduction -- Terrestrial neutron spectrometry and dosimetry -- Irradiation testing in the terrestrial field -- Neutron irradiation test facilities -- Review and discussion of experimental data -- Monte Carlo simulation methods -- Simulation results and their implications -- International standardization of the neutron test method -- Summary and challenges. 
588 0 |a Print version record. 
520 |a There are numerous elaborate and comprehensive textbooks and guidelines on stroke. However, busy clinicians are constantly bombarded with new knowledge for an infinite number of medical conditions. It becomes a challenge for them to tease out the important information that will help guide them through the care of the patient they have right before them. This handbook is thus conceptualized with both the busy clinician and the stroke patient needing urgent treatment in mind. By providing only essential information in a standard and user-friendly layout, it assists clinicians in making real-time decisions quickly and effectively with actual step-by-step guides on specific issues relevant to the care of stroke patients. The use of this practical handbook is instinctive with the topics arranged in chronological order, simulating the actual clinical scenario from a prehospital setting, consultation in the emergency room, admission to the hospital, to secondary prevention in the clinic. With contributions from over 30 stroke experts in Southeast Asia, this handbook is widely applicable in different medical settings and will certainly appeal to stroke specialists, general practitioners, nurses, paramedics, and medical students alike. 
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650 0 |a Soft errors (Computer science) 
650 0 |a Semiconductor storage devices. 
650 0 |a Neutron irradiation. 
650 0 |a Radiation dosimetry. 
650 0 |a Nuclear physics. 
650 6 |a Erreurs temporaires (Informatique) 
650 6 |a Ordinateurs  |x Mémoires à semi-conducteurs. 
650 6 |a Neutrons  |x Irradiation. 
650 6 |a Dosimétrie. 
650 6 |a Physique nucléaire. 
650 7 |a dosimetry.  |2 aat 
650 7 |a nuclear physics.  |2 aat 
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650 7 |a Soft errors (Computer science)  |2 fast 
650 7 |a Neutron irradiation  |2 fast 
650 7 |a Nuclear physics  |2 fast 
650 7 |a Radiation dosimetry  |2 fast 
650 7 |a Semiconductor storage devices  |2 fast 
700 1 |a Nakamura, Takashi,  |d 1939- 
776 0 8 |i Print version:  |t Terrestrial neutron-induced soft errors in advanced memory devices.  |d Hackensack, NJ : World Scientific, ©2008  |z 9789812778819  |z 9812778810  |w (DLC) 2008298667  |w (OCoLC)185032763 
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