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Scanning Force Microscopy : With Applications to Electric, Magnetic, and Atomic Forces.
Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science,...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York :
Oxford University Press,
1994.
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| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- PREFACE TO THE REVISED EDITION; PREFACE; Contents; Chapter 1 Mechanical Properties of Levers; Chapter 2 Resonance Enhancement; Chapter 3 Sources of Noise; Chapter 4 Tunneling Detection System; Chapter 5 Capacitance Detection System; Chapter 6 Homodyne Detection System; Chapter 7 Heterodyne Detection System; Chapter 8 Laser-Diode Feedback Detection System; Chapter 9 Polarization Detection System; Chapter 10 Deflection Detection System; Chapter 11 Electric Force Microscopy; Chapter 12 Magnetic Force Microscopy; Chapter 13 Atomic Force Microscopy; References; Index.