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Scanning Force Microscopy : With Applications to Electric, Magnetic, and Atomic Forces.
Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science,...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York :
Oxford University Press,
1994.
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| Temas: | |
| Acceso en línea: | Texto completo |
MARC
| LEADER | 00000cam a2200000Mi 4500 | ||
|---|---|---|---|
| 001 | EBOOKCENTRAL_ocn475957730 | ||
| 003 | OCoLC | ||
| 005 | 20240329122006.0 | ||
| 006 | m o d | ||
| 007 | cr mn|---||||| | ||
| 008 | 091207s1994 nyu o 000 0 eng d | ||
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| 019 | |a 181842130 | ||
| 020 | |a 9780198022817 |q (electronic bk.) | ||
| 020 | |a 0198022816 |q (electronic bk.) | ||
| 020 | |a 9781602566286 | ||
| 020 | |a 1602566283 | ||
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| 029 | 1 | |a DEBBG |b BV044081914 | |
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| 035 | |a (OCoLC)475957730 |z (OCoLC)181842130 | ||
| 050 | 4 | |a QH212.S32 S27 1994eb |a QH212.S32S27 1991 | |
| 082 | 0 | 4 | |a 502.8 |a 502/.8/2 |
| 049 | |a UAMI | ||
| 100 | 1 | |a Sarid, Dror. | |
| 245 | 1 | 0 | |a Scanning Force Microscopy : |b With Applications to Electric, Magnetic, and Atomic Forces. |
| 260 | |a New York : |b Oxford University Press, |c 1994. | ||
| 300 | |a 1 online resource (284 pages) | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 520 | |a Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variet. | ||
| 505 | 0 | |a PREFACE TO THE REVISED EDITION; PREFACE; Contents; Chapter 1 Mechanical Properties of Levers; Chapter 2 Resonance Enhancement; Chapter 3 Sources of Noise; Chapter 4 Tunneling Detection System; Chapter 5 Capacitance Detection System; Chapter 6 Homodyne Detection System; Chapter 7 Heterodyne Detection System; Chapter 8 Laser-Diode Feedback Detection System; Chapter 9 Polarization Detection System; Chapter 10 Deflection Detection System; Chapter 11 Electric Force Microscopy; Chapter 12 Magnetic Force Microscopy; Chapter 13 Atomic Force Microscopy; References; Index. | |
| 588 | 0 | |a Print version record. | |
| 590 | |a ProQuest Ebook Central |b Ebook Central Academic Complete | ||
| 650 | 0 | |a Scanning force microscopy. | |
| 650 | 0 | |a Surfaces (Physics) | |
| 650 | 6 | |a Microscopie à effet de force et à balayage. | |
| 650 | 6 | |a Surfaces (Physique) | |
| 650 | 7 | |a Scanning force microscopy |2 fast | |
| 650 | 7 | |a Surfaces (Physics) |2 fast | |
| 653 | |a Scanning force microscopy. | ||
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| 776 | 1 | |z 9780195062700 | |
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