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X-Ray Scattering From Semiconductors (2nd Edition).
This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the tech...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Singapore :
World Scientific,
2003.
|
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
| LEADER | 00000cam a2200000Mu 4500 | ||
|---|---|---|---|
| 001 | EBOOKCENTRAL_ocn475925272 | ||
| 003 | OCoLC | ||
| 005 | 20240329122006.0 | ||
| 006 | m o d | ||
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| 008 | 091207s2003 si o 000 0 eng d | ||
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| 019 | |a 815741888 | ||
| 020 | |a 9781860944581 |q (electronic bk.) | ||
| 020 | |a 1860944582 |q (electronic bk.) | ||
| 020 | |a 1281866369 | ||
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| 082 | 0 | 4 | |a 539.7222 |
| 049 | |a UAMI | ||
| 100 | 1 | |a Fewster, P. F. | |
| 245 | 1 | 0 | |a X-Ray Scattering From Semiconductors (2nd Edition). |
| 260 | |a Singapore : |b World Scientific, |c 2003. | ||
| 300 | |a 1 online resource (310 pages) | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 520 | |a This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection. | ||
| 505 | 0 | |a Copyright; Preface; Contents; 1 -- An Introduction to Semiconductor Materials; 2 -- An Introduction to X-Ray Scattering; 3 -- Equipment for Measuring Diffraction Patterns; 4 -- A Practical Guide to the Evaluation of Structural Parameters; Appendix 1; Subject Index. | |
| 588 | 0 | |a Print version record. | |
| 590 | |a ProQuest Ebook Central |b Ebook Central Academic Complete | ||
| 650 | 0 | |a X-rays. | |
| 650 | 6 | |a Rayons X. | |
| 650 | 7 | |a x-ray (radiation) |2 aat | |
| 650 | 7 | |a X-rays |2 fast | |
| 758 | |i has work: |a X-Ray Scattering from Semiconductors (2nd Edition) (Text) |1 https://id.oclc.org/worldcat/entity/E39PCXxfFRvQV6Xx6GDPH7pVmd |4 https://id.oclc.org/worldcat/ontology/hasWork | ||
| 776 | 1 | |z 9781860943607 | |
| 856 | 4 | 0 | |u https://ebookcentral.uam.elogim.com/lib/uam-ebooks/detail.action?docID=218699 |z Texto completo |
| 938 | |a EBL - Ebook Library |b EBLB |n EBL218699 | ||
| 938 | |a ProQuest MyiLibrary Digital eBook Collection |b IDEB |n 186636 | ||
| 994 | |a 92 |b IZTAP | ||