Advanced Production Testing of RF, SoC, and SiP Devices.
Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that ar...
Clasificación: | Libro Electrónico |
---|---|
Autor principal: | Kelly, Joe |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Norwood :
Artech House,
2006.
|
Colección: | Artech House microwave library.
|
Temas: | |
Acceso en línea: | Texto completo |
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