Cargando…

Advanced Production Testing of RF, SoC, and SiP Devices.

Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that ar...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Kelly, Joe
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Norwood : Artech House, 2006.
Colección:Artech House microwave library.
Temas:
Acceso en línea:Texto completo
Descripción
Sumario:Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that are critical to their work involving semiconductor devices. The book covers key measurement concepts for semiconductor device testing and assists engineers in explaining these concepts to management to aid in the reduction of project cost, time, and resources. Based on real-world experience and packed.
Descripción Física:1 online resource (325 pages)
ISBN:9781580537100
1580537103
9781580537094
158053709X