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Biological Low-voltage Scanning Electron Microscopy.
Major improvements in instrumentation and specimen preparation have brought SEM to the fore as a biological imaging technique. In FESEM, a field-emission cathode placed in the electron gun of a scanning electron microscope provides narrower probing beams and high electron energy. The result is impro...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Dordrecht :
Springer,
2007.
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| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 100 | 1 | |a Pawley, James. | |
| 245 | 1 | 0 | |a Biological Low-voltage Scanning Electron Microscopy. |
| 260 | |a Dordrecht : |b Springer, |c 2007. | ||
| 300 | |a 1 online resource (328 pages) | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 505 | 0 | |a Front Matter; The Early Development of the Scanning Electron Microscope; LVSEM for Biology; The Aberration-Corrected SEM; Noise and Its Effects on the Low-Voltage SEM; High-Resolution, Low Voltage, Field-Emission Scanning Electron Microscopy (HRLVFESEM) Applications for Cell Biology and Specimen Preparation Protocols; Molecular Labeling for Correlative Microscopy: LM, LVSEM, TEM, EF-TEM and HVEM; Low kV and Video-Rate, Beam-Tilt Stereo for Viewing Live-Time Experiments in the SEM; High-Resolution and Low-Voltage SEM of Plant Cells. | |
| 505 | 8 | |a High-Resolution Cryoscanning Electron Microscopy of Biological SamplesDevelopments in Instrumentation for Microanalysis in Low-Voltage Scanning Electron Microscopy; Back Matter. | |
| 520 | |a Major improvements in instrumentation and specimen preparation have brought SEM to the fore as a biological imaging technique. In FESEM, a field-emission cathode placed in the electron gun of a scanning electron microscope provides narrower probing beams and high electron energy. The result is improved spatial resolution and minimized sample charging and damage. Images produced are less destroyed and have a spatial resolution down to 1.5 nm, three to six times better than conventional SEM. Although this imaging technique has undergone tremendous developments, it is still poorly represented in. | ||
| 588 | 0 | |a Print version record. | |
| 590 | |a ProQuest Ebook Central |b Ebook Central Academic Complete | ||
| 650 | 0 | |a Low-voltage scanning electron microscopy. | |
| 650 | 0 | |a Field emission cathodes. | |
| 650 | 0 | |a Scanning electron microscopes. | |
| 650 | 6 | |a Microscopie électronique à balayage à basse tension. | |
| 650 | 6 | |a Cathodes à émission de champ. | |
| 650 | 6 | |a Microscopes électroniques à balayage. | |
| 650 | 7 | |a Field emission cathodes |2 fast | |
| 650 | 7 | |a Low-voltage scanning electron microscopy |2 fast | |
| 650 | 7 | |a Scanning electron microscopes |2 fast | |
| 700 | 1 | |a Schatten, Heide. | |
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| 776 | 1 | |z 9780387729701 | |
| 856 | 4 | 0 | |u https://ebookcentral.uam.elogim.com/lib/uam-ebooks/detail.action?docID=337828 |z Texto completo |
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