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EBOOKCENTRAL_ocn429993927 |
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20240329122006.0 |
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m o d |
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cr cnu---unuuu |
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090811s2009 nyua ob 001 0 eng d |
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|a 923657598
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|a 9781607419327
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|a 1607419327
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|a (OCoLC)429993927
|z (OCoLC)923657598
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|a QC611.6.Q35
|b K56 2009eb
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|a TEC
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|a TEC
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|a 621.3815/2
|2 22
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|a UAMI
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|a Quantum dots :
|b research, technology and applications /
|c Randolf W. Knoss, editor.
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|a New York :
|b Nova Science Publishers,
|c ©2009.
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|a 1 online resource (xvi, 691 pages) :
|b illustrations (some color)
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
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|a Includes bibliographical references and index.
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|a Print version record.
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|a QUANTUM DOTS: RESEARCH, TECHNOLOGY AND APPLICATIONS -- NOTICE TO THE READER -- CONTENTS -- PREFACE -- FEW-ELECTRON SEMICONDUCTOR QUANTUMDOTS IN MAGNETIC FIELD:THEORY AND METHODS -- Abstract -- 1. Introduction -- 2. 2D Semiconductor Quantum Dots -- 3. Parabolic Confinement Potential -- 4. Other Confinement Potentials -- 5. Theory -- 6. General Methods -- 7. Quantum Monte Carlo methods -- 7.1. Variational Monte Carlo Method -- 7.2. Diffusion Monte Carlo Method -- 8. The Simplest 2D Semiconductor Quantum Dot (N=2) -- 8.1. Exact Numerical Diagonalization
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|a 8.2. Variational Theory9. Quantum Hall Limit -- 10. Generalized Description of Few-Electron SemiconductorQuantum Dots in an Arbitrary Perpendicular MagneticField -- 11. Conclusion -- References -- INVESTIGATIONS OF ELECTRONIC STATESIN SELF-ASSEMBLED INAS/GAASQUANTUM-DOT STRUCTURES -- Abstract -- 1. Introduction -- 2. Space-Charge Techniques -- 2.1. Capacitance-Voltage Spectroscopy -- 2.2. Deep-Level Transient Spectroscopy -- 2.3. Laplace-Transform Deep-Level Transient Spectroscopy -- 3. Coexistence of Deep Levels with Optically Active QuantumDots
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|a 3.1. Characterization of Electronic Structure by CV Spectroscopy3.2. DLTS Characterization of Electronic Structure in Quantum-DotStructures -- 3.3. Fine Structures of the Deep Levels Probed with LDLTS -- 4. Effects of Rapid Thermal Annealing on QD Structures -- 4.1. Postgrowth Rapid Thermal Annealing -- 4.2. Effects of Annealing on PL Spectra -- 4.3. Effects of Annealing on DLTS Spectra -- 5. Electron Emissions from QD Intrinsic States -- 5.1. Preliminary Investigation of Carrier Emission from the Electronic Statesof Self-assembled InAs QDs by LDLTS
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|a 5.2. Electron Emission from QD Intrinsic States6. Conclusion -- References -- CHEMICALLY DEPOSITED THIN FILMS OF CLOSEPACKED CADMIUM SELENIDE QUANTUM DOTS:PHOTOPHYSICS, OPTICAL AND ELECTRICALPROPERTIES -- Abstract -- 1. Introduction -- 2. The Chemical Synthetic Route to Nanostructured CdSe in ThinFilm Form -- 3. Structural Characterization of Close Packed CdSe QDs in ThinFilm Form -- 3.1. Identification and Estimation of the Average Crystal Size of the Nanostructured CdSe Thin Films
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|a 4. Electronic Transitions and Optical Properties of theSynthesized Thin Films Composed by 3D Arrays of CdSeQuantum Dots4.1. Band Structure Considerations for Macrocrystalline Cubic CdSe -- 4.2. The Influence of Size Quantization. A Simple Picture -- 4.3. Experimental Electronic Spectra of Nanostructured CdSe Thin Films. The Fundamental “Band-to-Band� Electronic Transitions -- 4.4. Size Evolution of the Fundamental “Interband� Electronic Transitions:Analysis of the Three-Dimensional Charge Carrier ConfinementEffects (Quantum Size Effects)
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|a ProQuest Ebook Central
|b Ebook Central Academic Complete
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650 |
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|a Quantum dots.
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650 |
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|a Semiconductors.
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650 |
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2 |
|a Quantum Dots
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|a Semiconductors
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|a Points quantiques.
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|a Semi-conducteurs.
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|a semiconductor.
|2 aat
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|a TECHNOLOGY & ENGINEERING
|x Electronics
|x Solid State.
|2 bisacsh
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|a TECHNOLOGY & ENGINEERING
|x Electronics
|x Semiconductors.
|2 bisacsh
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650 |
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|a Quantum dots
|2 fast
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|a Semiconductors
|2 fast
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|a Knoss, Randolf W.
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758 |
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|i has work:
|a Quantum dots (Text)
|1 https://id.oclc.org/worldcat/entity/E39PCFJKdCQrDq6qpbBQ87whBP
|4 https://id.oclc.org/worldcat/ontology/hasWork
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776 |
0 |
8 |
|i Print version:
|t Quantum dots.
|d New York : Nova Science Publishers, ©2009
|z 9781604569308
|z 1604569301
|w (DLC) 2008032306
|w (OCoLC)235926726
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856 |
4 |
0 |
|u https://ebookcentral.uam.elogim.com/lib/uam-ebooks/detail.action?docID=3018178
|z Texto completo
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938 |
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|a ProQuest Ebook Central
|b EBLB
|n EBL3018178
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938 |
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|a EBSCOhost
|b EBSC
|n 281174
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994 |
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|a 92
|b IZTAP
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