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Characterization of high Tc materials and devices by electron microscopy /
This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron micros...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Cambridge ; New York :
Cambridge University Press,
2000.
|
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 245 | 0 | 0 | |a Characterization of high Tc materials and devices by electron microscopy / |c edited by Nigel D. Browning, Stephen J. Pennycook. |
| 260 | |a Cambridge ; |a New York : |b Cambridge University Press, |c 2000. | ||
| 300 | |a 1 online resource (xii, 391 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 347 | |a data file | ||
| 380 | |a Bibliography | ||
| 504 | |a Includes bibliographical references. | ||
| 505 | 0 | |a Cover; Half-title; Title; Copyright; Contents; Contributors; Preface; 1 High-resolution transmission electron microscopy; 2 Holography in the transmission electron microscope; 3 Microanalysis by scanning transmission electron microscopy; 4 Specimen preparation for transmission electron microscopy; 5 Low-temperature scanning electron microscopy; 6 Scanning tunneling microscopy; 7 Identification of new superconducting compounds by electron microscopy; 8 Valence band electron energy loss spectroscopy (EELS) of oxide superconductors. | |
| 520 | |a This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. | ||
| 588 | 0 | |a Print version record. | |
| 546 | |a English. | ||
| 590 | |a ProQuest Ebook Central |b Ebook Central Academic Complete | ||
| 590 | |a eBooks on EBSCOhost |b EBSCO eBook Subscription Academic Collection - Worldwide | ||
| 650 | 0 | |a High temperature superconductors. | |
| 650 | 0 | |a Electron microscopy |x Technique. | |
| 650 | 6 | |a Supraconducteurs à hautes températures. | |
| 650 | 6 | |a Microscopie électronique |x Technique. | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Superconductors & Superconductivity. |2 bisacsh | |
| 650 | 7 | |a Electron microscopy |x Technique |2 fast | |
| 650 | 7 | |a High temperature superconductors |2 fast | |
| 650 | 7 | |a Elektronenmikroskopie |2 gnd | |
| 650 | 7 | |a Hochtemperatursupraleiter |2 gnd | |
| 700 | 1 | |a Browning, Nigel D. | |
| 700 | 1 | |a Pennycook, Stephen J. | |
| 758 | |i has work: |a Characterization of high Tc materials and devices by electron microscopy (Text) |1 https://id.oclc.org/worldcat/entity/E39PCYXtT3PG3M6G6RrPFGpbgq |4 https://id.oclc.org/worldcat/ontology/hasWork | ||
| 776 | 0 | 8 | |i Print version: |t Characterization of high Tc materials and devices by electron microscopy. |d Cambridge ; New York : Cambridge University Press, 2000 |w (DLC) 99018754 |
| 856 | 4 | 0 | |u https://ebookcentral.uam.elogim.com/lib/uam-ebooks/detail.action?docID=201990 |z Texto completo |
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