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Characterization of high Tc materials and devices by electron microscopy /
This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron micros...
| Clasificación: | Libro Electrónico |
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| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Cambridge ; New York :
Cambridge University Press,
2000.
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| Temas: | |
| Acceso en línea: | Texto completo |
| Sumario: | This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. |
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| Descripción Física: | 1 online resource (xii, 391 pages) : illustrations |
| Bibliografía: | Includes bibliographical references. |
| ISBN: | 0511039662 9780511039669 9780511534829 0511534825 9780511038150 0511038151 9786610417018 6610417016 1107113016 9781107113015 1280417013 9781280417016 0511175078 9780511175077 0511155174 9780511155178 0511328664 9780511328664 9780521031707 0521031702 |