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Electron microscopy and analysis /

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rap...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Goodhew, Peter J.
Otros Autores: Beanland, R., Humphreys, F. J.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: London : Taylor & Francis, 2001.
Edición:3rd ed.
Temas:
Acceso en línea:Texto completo
Descripción
Sumario:Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material.
Notas:Previous edition: 1988.
Descripción Física:1 online resource (xi, 251 pages) : illustrations
Bibliografía:Includes bibliographical references and index.
ISBN:0748409688
9780748409686
0203184254
9780203184257
9781420017250
142001725X