To lead the free world : American nationalism and the cultural roots of the Cold War /

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Explores the ideological underpinnings of public support for American Cold War foreign policy. The author argues that Americans ultimately came to equate national loyalty with global anticommunism and an interventionist foreign policy.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Fousek, John, 1959-
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Chapel Hill : University of North Carolina Press, ©2000.
Temas:
1900-1999
Nationalism > United States > History > 20th century.
Popular culture > Political aspects > United States > History > 20th century.
Discourse analysis > United States.
Public opinion > United States > History > 20th century.
Nationalisme > États-Unis > Histoire > 20e siècle.
Culture populaire > Aspect politique > États-Unis > Histoire > 20e siècle.
Analyse du discours > États-Unis.
Opinion publique > États-Unis > Histoire > 20e siècle.
POLITICAL SCIENCE > Government > International.
POLITICAL SCIENCE > International Relations > General.
Diplomatic relations > Philosophy
Discourse analysis
Nationalism
Popular culture > Political aspects
Public opinion
Nationalisme.
Koude Oorlog.
Außenpolitik
Meinungsbildung
Volkskultur
Öffentliche Meinung
Nationalismus
Popular culture > Political aspects > United States.
United States > Foreign relations > 1945-1953 > Public opinion.
United States > Foreign relations > 1945-1953 > Philosophy.
États-Unis > Relations extérieures > 1945-1953 > Opinion publique.
États-Unis > Relations extérieures > 1945-1953 > Philosophie.
United States
USA
History
Acceso en línea:Texto completo
Descripción
Sumario:Explores the ideological underpinnings of public support for American Cold War foreign policy. The author argues that Americans ultimately came to equate national loyalty with global anticommunism and an interventionist foreign policy.
Descripción Física:1 online resource (xiv, 253 pages) : illustrations
Bibliografía:Includes bibliographical references (pages 231-239) and index.
ISBN:0807860670
9780807860670

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