A designer's guide to built-in self-test /

A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is w...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Stroud, Charles E.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Boston : Kluwer Academic Publishers, ©2002.
Colección:Frontiers in electronic testing.
Temas:
Electronic apparatus and appliances > Testing.
Electronic apparatus and appliances > Design and construction.
Automatic test equipment.
Appareils électroniques > Essais.
Appareils électroniques > Conception et construction.
Équipement d'essai automatique.
TECHNOLOGY & ENGINEERING > Electronics > Microelectronics.
TECHNOLOGY & ENGINEERING > Electronics > Digital.
Automatic test equipment
Electronic apparatus and appliances > Design and construction
Electronic apparatus and appliances > Testing
Andre fag (naturvidenskab og teknik) > Andre fag
engineering
circuits
computertechnieken
computer techniques
computer software
elektrotechniek
electrical engineering
Engineering (General)
Techniek (algemeen)
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Preliminaries; Table of Contents; Preface; About the Author; 1. An Overview of BIST; 2. Fault Models, Detection, and Simulation; 3. Design for Testability; 4. Test Pattern Generation; 5. Output Response Analysis; 6. Manufacturing and System-Level Use of BIST; 7. Built-In Logic Block Observer; 8. Pseudo-Exhaustive BIST; 9. Circular BIST; 10. Scan-Based BIST; 11. Non-Intrusive BIST; 12. BIST for Regular Structures; 13. BIST for FPGAs and CPLDs; 14. Applying Digital BIST to Mixed-Signal Systems; 15. Merging BIST and Concurrent Fault Detection; Acronyms; Bibliography; Index.

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