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A designer's guide to built-in self-test /
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is w...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Boston :
Kluwer Academic Publishers,
©2002.
|
| Colección: | Frontiers in electronic testing.
|
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
| LEADER | 00000cam a2200000 a 4500 | ||
|---|---|---|---|
| 001 | EBOOKCENTRAL_ocm51783984 | ||
| 003 | OCoLC | ||
| 005 | 20240329122006.0 | ||
| 006 | m o d | ||
| 007 | cr cn||||||||| | ||
| 008 | 030304s2002 maua ob 001 0 eng d | ||
| 040 | |a N$T |b eng |e pn |c N$T |d OCLCQ |d YDXCP |d NLGGC |d OCLCQ |d TUU |d OCLCQ |d TNF |d TULIB |d OCLCQ |d REDDC |d BAKER |d EBLCP |d UAB |d DKDLA |d OKU |d MERUC |d CCO |d E7B |d IDEBK |d OCLCO |d SINTU |d GW5XE |d OCLCF |d OCLCQ |d COO |d OCLCQ |d AZK |d LOA |d MOR |d PIFBR |d ZCU |d OTZ |d OCLCQ |d COCUF |d OCLCQ |d WY@ |d U3W |d ROC |d LUE |d RCC |d STF |d WRM |d OCLCQ |d CEF |d NRAMU |d MUO |d ICG |d OCLCQ |d INT |d VT2 |d TOF |d OCLCQ |d WYU |d CANPU |d OCLCQ |d W2U |d DKC |d OCLCQ |d CNTRU |d OCLCQ |d WURST |d UKCRE |d AJS |d UKAHL |d OCLCO |d OCLCQ |d OCLCO |d OCLCL | ||
| 019 | |a 55046959 |a 66730971 |a 70739574 |a 228375349 |a 474434092 |a 475672220 |a 517798954 |a 559290465 |a 647316764 |a 722220678 |a 733802419 |a 808037124 |a 818973263 |a 888722588 |a 961669032 |a 962590173 |a 966092900 |a 988461267 |a 991905873 |a 991983633 |a 994779132 |a 1020522272 |a 1035704006 |a 1037920520 |a 1038654064 |a 1044561334 |a 1045507735 |a 1055375098 |a 1056321330 |a 1064098800 |a 1075538085 |a 1078845051 |a 1078863269 |a 1081221219 |a 1087454117 |a 1097348539 |a 1153520318 |a 1228558799 | ||
| 020 | |a 0306475049 |q (electronic bk.) | ||
| 020 | |a 9780306475047 |q (electronic bk.) | ||
| 020 | |a 6610208263 | ||
| 020 | |a 9786610208265 | ||
| 020 | |z 1402070500 | ||
| 020 | |z 9781402070501 | ||
| 029 | 1 | |a AU@ |b 000053244521 | |
| 029 | 1 | |a AU@ |b 000058030054 | |
| 029 | 1 | |a DEBBG |b BV044091050 | |
| 029 | 1 | |a NLGGC |b 252677374 | |
| 029 | 1 | |a NZ1 |b 14234281 | |
| 029 | 1 | |a NZ1 |b 15562440 | |
| 035 | |a (OCoLC)51783984 |z (OCoLC)55046959 |z (OCoLC)66730971 |z (OCoLC)70739574 |z (OCoLC)228375349 |z (OCoLC)474434092 |z (OCoLC)475672220 |z (OCoLC)517798954 |z (OCoLC)559290465 |z (OCoLC)647316764 |z (OCoLC)722220678 |z (OCoLC)733802419 |z (OCoLC)808037124 |z (OCoLC)818973263 |z (OCoLC)888722588 |z (OCoLC)961669032 |z (OCoLC)962590173 |z (OCoLC)966092900 |z (OCoLC)988461267 |z (OCoLC)991905873 |z (OCoLC)991983633 |z (OCoLC)994779132 |z (OCoLC)1020522272 |z (OCoLC)1035704006 |z (OCoLC)1037920520 |z (OCoLC)1038654064 |z (OCoLC)1044561334 |z (OCoLC)1045507735 |z (OCoLC)1055375098 |z (OCoLC)1056321330 |z (OCoLC)1064098800 |z (OCoLC)1075538085 |z (OCoLC)1078845051 |z (OCoLC)1078863269 |z (OCoLC)1081221219 |z (OCoLC)1087454117 |z (OCoLC)1097348539 |z (OCoLC)1153520318 |z (OCoLC)1228558799 | ||
| 050 | 4 | |a TK7878.4 |b .S78 2002eb | |
| 072 | 7 | |a TEC |x 008070 |2 bisacsh | |
| 072 | 7 | |a TEC |x 008060 |2 bisacsh | |
| 082 | 0 | 4 | |a 621.381 |2 21 |
| 049 | |a UAMI | ||
| 100 | 1 | |a Stroud, Charles E. | |
| 245 | 1 | 2 | |a A designer's guide to built-in self-test / |c Charles E. Stroud. |
| 260 | |a Boston : |b Kluwer Academic Publishers, |c ©2002. | ||
| 300 | |a 1 online resource (xvi, 319 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 347 | |a data file | ||
| 490 | 1 | |a Frontiers in electronic testing | |
| 504 | |a Includes bibliographical references (pages 291-312) and index. | ||
| 588 | 0 | |a Print version record. | |
| 520 | |a A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers. | ||
| 505 | 0 | |a Preliminaries; Table of Contents; Preface; About the Author; 1. An Overview of BIST; 2. Fault Models, Detection, and Simulation; 3. Design for Testability; 4. Test Pattern Generation; 5. Output Response Analysis; 6. Manufacturing and System-Level Use of BIST; 7. Built-In Logic Block Observer; 8. Pseudo-Exhaustive BIST; 9. Circular BIST; 10. Scan-Based BIST; 11. Non-Intrusive BIST; 12. BIST for Regular Structures; 13. BIST for FPGAs and CPLDs; 14. Applying Digital BIST to Mixed-Signal Systems; 15. Merging BIST and Concurrent Fault Detection; Acronyms; Bibliography; Index. | |
| 590 | |a ProQuest Ebook Central |b Ebook Central Academic Complete | ||
| 650 | 0 | |a Electronic apparatus and appliances |x Testing. | |
| 650 | 0 | |a Electronic apparatus and appliances |x Design and construction. | |
| 650 | 0 | |a Automatic test equipment. | |
| 650 | 6 | |a Appareils électroniques |x Essais. | |
| 650 | 6 | |a Appareils électroniques |x Conception et construction. | |
| 650 | 6 | |a Équipement d'essai automatique. | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Electronics |x Microelectronics. |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Electronics |x Digital. |2 bisacsh | |
| 650 | 7 | |a Automatic test equipment |2 fast | |
| 650 | 7 | |a Electronic apparatus and appliances |x Design and construction |2 fast | |
| 650 | 7 | |a Electronic apparatus and appliances |x Testing |2 fast | |
| 653 | |a Andre fag (naturvidenskab og teknik) |a Andre fag | ||
| 653 | 0 | 0 | |a engineering |
| 653 | 0 | 0 | |a circuits |
| 653 | 0 | 0 | |a computertechnieken |
| 653 | 0 | 0 | |a computer techniques |
| 653 | 0 | 0 | |a computer software |
| 653 | 0 | 0 | |a elektrotechniek |
| 653 | 0 | 0 | |a electrical engineering |
| 653 | 1 | 0 | |a Engineering (General) |
| 653 | 1 | 0 | |a Techniek (algemeen) |
| 758 | |i has work: |a A designer's guide to built-in self-test (Text) |1 https://id.oclc.org/worldcat/entity/E39PCGVwhHhp8Yf6PW7M9thmBP |4 https://id.oclc.org/worldcat/ontology/hasWork | ||
| 776 | 0 | 8 | |i Print version: |a Stroud, Charles E. |t Designer's guide to built-in self-test. |d Boston : Kluwer Academic Publishers, ©2002 |z 1402070500 |w (DLC) 2002016230 |w (OCoLC)49356026 |
| 830 | 0 | |a Frontiers in electronic testing. | |
| 856 | 4 | 0 | |u https://ebookcentral.uam.elogim.com/lib/uam-ebooks/detail.action?docID=3035650 |z Texto completo |
| 938 | |a Askews and Holts Library Services |b ASKH |n AH3772932 | ||
| 938 | |a Baker & Taylor |b BKTY |c 139.00 |d 139.00 |i 1402070500 |n 0003931790 |s active | ||
| 938 | |a EBL - Ebook Library |b EBLB |n EBL219665 | ||
| 938 | |a EBSCOhost |b EBSC |n 78408 | ||
| 938 | |a YBP Library Services |b YANK |n 2292180 | ||
| 994 | |a 92 |b IZTAP | ||