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Beam effects, surface topography, and depth profiling in surface analysis /
Written as a tutorial guide for newcomers to the field of surface analysis, this work is the first book ever published to feature photon, electron, and ion beam effects and beam damage to solids during surface and near-surface analysis and depth profiling. This introductory text describes the princi...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | , , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York :
Kluwer Academic,
©2002.
|
| Colección: | Methods of surface characterization ;
v. 5. |
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 245 | 0 | 0 | |a Beam effects, surface topography, and depth profiling in surface analysis / |c edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell. |
| 260 | |a New York : |b Kluwer Academic, |c ©2002. | ||
| 300 | |a 1 online resource (xix, 430 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a Methods of surface characterization ; |v v. 5 | |
| 504 | |a Includes bibliographical references and index. | ||
| 520 | |a Written as a tutorial guide for newcomers to the field of surface analysis, this work is the first book ever published to feature photon, electron, and ion beam effects and beam damage to solids during surface and near-surface analysis and depth profiling. This introductory text describes the principles, techniques, and methods vital for efficient surface analysis. A wealth of practical information is assembled in this single volume, including summary tables, extensive references, and 251 illustrative figures. | ||
| 588 | 0 | |a Print version record. | |
| 590 | |a ProQuest Ebook Central |b Ebook Central Academic Complete | ||
| 650 | 0 | |a Surfaces (Technology) |x Analysis. | |
| 650 | 0 | |a Materials |x Effect of radiation on. | |
| 650 | 6 | |a Surfaces (Technologie) |x Analyse. | |
| 650 | 6 | |a Matériaux |x Effets du rayonnement sur. | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Nanotechnology & MEMS. |2 bisacsh | |
| 650 | 7 | |a Materials |x Effect of radiation on |2 fast | |
| 650 | 7 | |a Surfaces (Technology) |x Analysis |2 fast | |
| 700 | 1 | |a Czanderna, Alvin Warren, |d 1930- |1 https://id.oclc.org/worldcat/entity/E39PCjxHr8PvVHwCwjmYRwrJtC | |
| 700 | 1 | |a Madey, Theodore E. | |
| 700 | 1 | |a Powell, C. J. |q (Cedric John) |1 https://id.oclc.org/worldcat/entity/E39PCjt9bQGtGv7cP7bwtxB7BK | |
| 758 | |i has work: |a Beam effects, surface topography, and depth profiling in surface analysis (Text) |1 https://id.oclc.org/worldcat/entity/E39PCGkTbT9wr3WXfmtyMTFqPP |4 https://id.oclc.org/worldcat/ontology/hasWork | ||
| 776 | 0 | 8 | |i Print version: |t Beam effects, surface topography, and depth profiling in surface analysis. |d New York : Kluwer Academic, ©2002 |z 0306458969 |
| 830 | 0 | |a Methods of surface characterization ; |v v. 5. | |
| 856 | 4 | 0 | |u https://ebookcentral.uam.elogim.com/lib/uam-ebooks/detail.action?docID=3035362 |z Texto completo |
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