Ninth European Powder Diffraction Conference : Prague, September 2-5, 2004.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin ; Boston : Oldenbourg Wissenschaftsverlag, [2015]
Colección:Zeitschrift für Kristallographie / Supplemente ; 23
Temas:
Geophysics. Cosmic physics.
Light & Optics.
Physics.
Physical Sciences & Mathematics.
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Frontmatter
  • Preface: Condensation of Scientific Knowledge on Powder Diffraction
  • Editorial Notes
  • European Powder Diffraction Conference Award
  • Table of Contents
  • I. METHOD DEVELOPMENT AND APPLICATION
  • I.1 Determination of Crystal Structure
  • Protein polycrystallography / Von Dreele, R.B. / Lee, P.L. / Zhang, Y.
  • Using the parallel tempering algorithm to overcome complex problems in structure determination of inorganic materials with laboratory X-rays / Bataille, T. / Mahé, N. / Le Fur, E. / Pivan, J.-Y. / Louër, D.
  • Molecular crystal structures from powder X-ray diffraction techniques / Cheung, Eugene Y. / Harris, Kenneth D.M.
  • On the uncertainty of lattice parameters refined from neutron diffraction data / Peplinski, B. / Többens, D.M. / Kockelmann, W. / Ibberson, R.M.
  • I.2 Qualitative and Quantitative Phase Analysis
  • Application of the Rietveld method to the severely superimposed diffraction patterns of technical products containing a large number of solid solution phases / Peplinski, B. / Köcher, P. / Kley, G.
  • Application of X-ray diffraction in forensic science / Kotrlý, Marek
  • I.3 Analysis of Microstructure and Macrostress
  • I.3.1 Residual Stresses
  • Diffraction stress analysis of grain interaction in polycrystalline materials / Welzel, U. / Fréour, S. / Kumar, A. / Mittemeijer, E.J.
  • Accurate absolute peak positions for multiple {hkl} residual stress analysis by means of misalignment corrections / Vermeulen, Arnold C.
  • Diffraction stress analysis of strongly fibre-textured gold layers / Kumar, A. / Welzel, U. / Mittemeijer, E.J.
  • Residual stress measurement of gold artefacts by Debye ring analysis / Zanola, P. / Benedetti, D. / Bontempi, E. / Villa, V. / Baronio, G. / Tosti, M. / Roberti, R. / Depero, L.E.
  • X-ray residual stress measurement in titanium nitride thin films / Dopita, M. / Rafaja, D.
  • I.3.2 Line Broadening Analysis
  • Dislocation line broadening / Kužel, R.
  • Considerations concerning Wilkens' theory of dislocation line-broadening / Armstrong, N. / Leoni, M. / Scardi, P.
  • Momentum method applied to evaluation of size and strain in ball-milled iron / Borbély, A. / Révész, A. / Groma, I.
  • Microstructure of severely deformed metals from X-ray line profile analysis / Gubicza, J. / Nam, N.H. / Máthis, K. / Stolyarov, V.V.
  • Burgers Vector Populations in hot rolled titanium determined by X-ray Peak Profile Analysis / Dragomir, I.C. / Castello-Branco, G.A. / Ribarik, G. / Garmestani, H. / Ungar, T. / Snyder, R.L.
  • Spatial fluctuations of the microstructure during deformation of Cu single crystals / Kerber, M. / Schafler, E. / Hanak, P. / Ribàrik, G. / Bernstorff, S. / Ungàr, T. / Zehetbauer, M.
  • Analysis of polydisperse ball-milled fluorite powders using a full pattern technique / Leoni, M. / De Giudici, G. / Biddau, R. / D'Incau, M. / Scardi, P.
  • Anisotropic microstrain broadening due to compositional inhomogeneities and its parametrisation / Leineweber, A. / Mittemeijer, E.J.
  • X-ray diffraction from epitaxial thin films: an analytical expression of the line profiles accounting for microstructure / Boulle, A. / Guinebretière, R. / Dauger, A.
  • Microstructure of post-deformed ECAPTi investigated by Multiple X-Ray Line Profile Analysis / Schafler, E. / Nyilas, K. / Bernstorff, S. / Zeipper, L. / Zehetbauer, M. / Ungàr, T.
  • The Dislocation-Structure and Crystallite- Size in Forsterite (Olivine) Deformed at 1400 °C by 11 GPa / Nyilas, Krisztián / Couvy, Hélène / Cordier, Patrick / Ungár, Tamás
  • Diffuse X-ray scattering from GaN/SiC (0001) thin films / Daniš, S. / Holý, V.
  • Test of applicability of some powder diffraction tools to nanocrystals / Kaszkur, Z.
  • Influence of coherent connection of crystalline blocks on the diffraction pattern of nanostructured materials / Cherepanova, S.V. / Tsybulya, S.V.
  • I.4 Texture
  • Automated Crystal Orientation Measurement by backscatter Kikuchi diffraction / Schwarzer, Robert A.
  • A simple technique for correcting diffraction intensities for the effects of preferred orientation in calcite samples / Battaglia, S. / Leoni, L.
  • Influence of extinction phenomenon on determination of the orientation distribution function / Gómez-Gasga, G. / Kryshtab, T. / Palacios-Gómez, J. / Ita de la Torre, A. de
  • II. INSTRUMENTAL
  • First test measurements at the new structure powder diffractometer (SPODI) at the FRM-II / Gilles, R. / Hoelzel, M. / Schlapp, M. / Elf, F. / Krimmer, B. / Boysen, H. / Fuess, H.
  • EXED
  • the new Extreme Environment Diffractometer at the Hahn-Meitner-Institut Berlin / Peters, J. / Lieutenant, K. / Clemens, D. / Mezei, F.
  • R2D2: a new neutron powder diffractometer at NFL / Wannberg, A. / Grönros, M. / Mellergård, A. / Karlsson, L-E. / Delaplane, R.G. / Lebech, B.
  • Bent perfect crystal monochromator at the monochromatic focusing condition / Choi, Y.N. / Kim, S.A. / Kim, S.K. / Kim, S.B. / Lee, C.H. / Mikula, P. / Vrána, M.
  • Multiple-reflection neutron bent-perfect-crystal (BPC) monochromator / Mikula, P. / Vrána, M. / Wagner, V.
  • Wavelength calibration in conventional SANS setup with a mechanical velocity selector / Almásy, L. / Len, A. / Markó, M. / Rétfalvi, E.
  • Neutron RTOF diffractometer FSD for residual stress investigation / Balagurov, A.M. / Bokuchava, G.D. / Kuzmin, E.S. / Tamonov, A.V. / Zhuk, V.V.
  • III. SOFTWARE DEVELOPMENT
  • Indexing with the successive dichotomy method, DICVOL04 / Louër, D. / Boultif, A.
  • Powder3D: An easy to use program for data reduction and graphical presentation of large numbers of powder diffraction patterns / Hinrichsen, B. / Dinnebier, R.E. / Jansen, M.
  • BRASS, the Bremen Rietveld analysis and structure suite / Birkenstock, J. / Fischer, R.X. / Messner, T.
  • FAULTS, a new program for refinement of powder diffraction patterns from layered structures / Casas-Cabanas, M. / Rodríguez-Carvajal, J. / Palacín, M.R.
  • PM2K: a flexible program implementing Whole Powder Pattern Modelling / Leoni, M. / Confente, T. / Scardi, P.
  • Calculating the peak shape of axially focussing powder diffractometers / Többens, D.M.
  • IV. MATERIALS
  • IV. 1 Thin Layers
  • X-ray scattering from interface dislocations in highly mismatched oxide epitaxial films / Guinebretière, R. / Boulle, A. / Masson, O. / Dauger, A.
  • Influence of magnetron sputtering conditions on the parameters of TiN coatings on steel substrates / Mirchev, R. / Antonov, V. / Iordanova, I. / Kelly, P.J.
  • Structural and microstructural characterisation of ZrN coatings for decorative applications / Zanola, P. / Bontempi, E. / Gelfi, M. / Tosti, M. / Roberti, R. / Depero, L.E.
  • Chalcogenide films on glass substrate as attenuators of X-ray radiation / Lukić, S.R. / Petrović, D.M. / Štrbac, G.R. / Štrbac, D.D.
  • Effect of annealing conditions on structural transformation of ZnS thin film / Kryshtab, T. / Palacios Gómez, J. / Mazin, M.
  • Electrocrystallization of Pt layers onto Au substrates; an X-ray diffraction study / Molina, I. Yu. / Plyasova, L.M. / Cherepanova, S.V. / Savinova, E.R. / Tsirlina, G.A.
  • Residual stress mapping in the zirconia electrolyte layer of a high-temperature solid oxide fuel cell / Fischer, Werner / Blass, Günther
  • Ultrashort period Cu/Si and Ni/C multilayers for X-ray mirrors / Jergel, M. / Ožvold, M. / Senderák, R. / Luby, Š. / Majková, E.
  • IV. 2 Nanocrystalline Materials
  • Microstructure of nanocrystalline materials studied by powder diffraction
  • Preparation and characterization of isometric gold nanoparticles with pre-calculated size / Šlouf, M. / Kužel, R. / Matěj, Z.

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