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Ninth European Powder Diffraction Conference : Prague, September 2-5, 2004.
| Clasificación: | Libro Electrónico |
|---|---|
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Berlin ; Boston :
Oldenbourg Wissenschaftsverlag,
[2015]
|
| Colección: | Zeitschrift für Kristallographie / Supplemente ;
23 |
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 245 | 0 | 0 | |a Ninth European Powder Diffraction Conference : |b Prague, September 2-5, 2004. |
| 264 | 1 | |a Berlin ; |a Boston : |b Oldenbourg Wissenschaftsverlag, |c [2015] | |
| 264 | 4 | |c ©2006 | |
| 300 | |a 1 online resource | ||
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| 490 | 0 | |a Zeitschrift für Kristallographie / Supplemente ; |v 23 | |
| 588 | 0 | |a Online resource; title from PDF title page (publisher's Web site, viewed Dec. 15, 2016). | |
| 505 | 0 | 0 | |6 880-01 |t Frontmatter -- |t Preface: Condensation of Scientific Knowledge on Powder Diffraction -- |t Editorial Notes -- |t European Powder Diffraction Conference Award -- |t Table of Contents -- |t I. METHOD DEVELOPMENT AND APPLICATION -- |t I.1 Determination of Crystal Structure -- |t Protein polycrystallography / |r Von Dreele, R.B. / Lee, P.L. / Zhang, Y. -- |t Using the parallel tempering algorithm to overcome complex problems in structure determination of inorganic materials with laboratory X-rays / |r Bataille, T. / Mahé, N. / Le Fur, E. / Pivan, J.-Y. / Louër, D. -- |t Molecular crystal structures from powder X-ray diffraction techniques / |r Cheung, Eugene Y. / Harris, Kenneth D.M. -- |t On the uncertainty of lattice parameters refined from neutron diffraction data / |r Peplinski, B. / Többens, D.M. / Kockelmann, W. / Ibberson, R.M. -- |t I.2 Qualitative and Quantitative Phase Analysis -- |t Application of the Rietveld method to the severely superimposed diffraction patterns of technical products containing a large number of solid solution phases / |r Peplinski, B. / Köcher, P. / Kley, G. -- |t Application of X-ray diffraction in forensic science / |r Kotrlý, Marek -- |t I.3 Analysis of Microstructure and Macrostress -- |t I.3.1 Residual Stresses -- |t Diffraction stress analysis of grain interaction in polycrystalline materials / |r Welzel, U. / Fréour, S. / Kumar, A. / Mittemeijer, E.J. -- |t Accurate absolute peak positions for multiple {hkl} residual stress analysis by means of misalignment corrections / |r Vermeulen, Arnold C. -- |t Diffraction stress analysis of strongly fibre-textured gold layers / |r Kumar, A. / Welzel, U. / Mittemeijer, E.J. -- |t Residual stress measurement of gold artefacts by Debye ring analysis / |r Zanola, P. / Benedetti, D. / Bontempi, E. / Villa, V. / Baronio, G. / Tosti, M. / Roberti, R. / Depero, L.E. -- |t X-ray residual stress measurement in titanium nitride thin films / |r Dopita, M. / Rafaja, D. -- |t I.3.2 Line Broadening Analysis -- |t Dislocation line broadening / |r Kužel, R. -- |t Considerations concerning Wilkens' theory of dislocation line-broadening / |r Armstrong, N. / Leoni, M. / Scardi, P. -- |t Momentum method applied to evaluation of size and strain in ball-milled iron / |r Borbély, A. / Révész, A. / Groma, I. -- |t Microstructure of severely deformed metals from X-ray line profile analysis / |r Gubicza, J. / Nam, N.H. / Máthis, K. / Stolyarov, V.V. -- |t Burgers Vector Populations in hot rolled titanium determined by X-ray Peak Profile Analysis / |r Dragomir, I.C. / Castello-Branco, G.A. / Ribarik, G. / Garmestani, H. / Ungar, T. / Snyder, R.L. -- |t Spatial fluctuations of the microstructure during deformation of Cu single crystals / |r Kerber, M. / Schafler, E. / Hanak, P. / Ribàrik, G. / Bernstorff, S. / Ungàr, T. / Zehetbauer, M. -- |t Analysis of polydisperse ball-milled fluorite powders using a full pattern technique / |r Leoni, M. / De Giudici, G. / Biddau, R. / D'Incau, M. / Scardi, P. -- |t Anisotropic microstrain broadening due to compositional inhomogeneities and its parametrisation / |r Leineweber, A. / Mittemeijer, E.J. -- |t X-ray diffraction from epitaxial thin films: an analytical expression of the line profiles accounting for microstructure / |r Boulle, A. / Guinebretière, R. / Dauger, A. -- |t Microstructure of post-deformed ECAPTi investigated by Multiple X-Ray Line Profile Analysis / |r Schafler, E. / Nyilas, K. / Bernstorff, S. / Zeipper, L. / Zehetbauer, M. / Ungàr, T. -- |t The Dislocation-Structure and Crystallite- Size in Forsterite (Olivine) Deformed at 1400 °C by 11 GPa / |r Nyilas, Krisztián / Couvy, Hélène / Cordier, Patrick / Ungár, Tamás -- |t Diffuse X-ray scattering from GaN/SiC (0001) thin films / |r Daniš, S. / Holý, V. -- |t Test of applicability of some powder diffraction tools to nanocrystals / |r Kaszkur, Z. -- |t Influence of coherent connection of crystalline blocks on the diffraction pattern of nanostructured materials / |r Cherepanova, S.V. / Tsybulya, S.V. -- |t I.4 Texture -- |t Automated Crystal Orientation Measurement by backscatter Kikuchi diffraction / |r Schwarzer, Robert A. -- |t A simple technique for correcting diffraction intensities for the effects of preferred orientation in calcite samples / |r Battaglia, S. / Leoni, L. -- |t Influence of extinction phenomenon on determination of the orientation distribution function / |r Gómez-Gasga, G. / Kryshtab, T. / Palacios-Gómez, J. / Ita de la Torre, A. de -- |t II. INSTRUMENTAL -- |t First test measurements at the new structure powder diffractometer (SPODI) at the FRM-II / |r Gilles, R. / Hoelzel, M. / Schlapp, M. / Elf, F. / Krimmer, B. / Boysen, H. / Fuess, H. -- |t EXED -- the new Extreme Environment Diffractometer at the Hahn-Meitner-Institut Berlin / |r Peters, J. / Lieutenant, K. / Clemens, D. / Mezei, F. -- |t R2D2: a new neutron powder diffractometer at NFL / |r Wannberg, A. / Grönros, M. / Mellergård, A. / Karlsson, L-E. / Delaplane, R.G. / Lebech, B. -- |t Bent perfect crystal monochromator at the monochromatic focusing condition / |r Choi, Y.N. / Kim, S.A. / Kim, S.K. / Kim, S.B. / Lee, C.H. / Mikula, P. / Vrána, M. -- |t Multiple-reflection neutron bent-perfect-crystal (BPC) monochromator / |r Mikula, P. / Vrána, M. / Wagner, V. -- |t Wavelength calibration in conventional SANS setup with a mechanical velocity selector / |r Almásy, L. / Len, A. / Markó, M. / Rétfalvi, E. -- |t Neutron RTOF diffractometer FSD for residual stress investigation / |r Balagurov, A.M. / Bokuchava, G.D. / Kuzmin, E.S. / Tamonov, A.V. / Zhuk, V.V. -- |t III. SOFTWARE DEVELOPMENT -- |t Indexing with the successive dichotomy method, DICVOL04 / |r Louër, D. / Boultif, A. -- |t Powder3D: An easy to use program for data reduction and graphical presentation of large numbers of powder diffraction patterns / |r Hinrichsen, B. / Dinnebier, R.E. / Jansen, M. -- |t BRASS, the Bremen Rietveld analysis and structure suite / |r Birkenstock, J. / Fischer, R.X. / Messner, T. -- |t FAULTS, a new program for refinement of powder diffraction patterns from layered structures / |r Casas-Cabanas, M. / Rodríguez-Carvajal, J. / Palacín, M.R. -- |t PM2K: a flexible program implementing Whole Powder Pattern Modelling / |r Leoni, M. / Confente, T. / Scardi, P. -- |t Calculating the peak shape of axially focussing powder diffractometers / |r Többens, D.M. -- |t IV. MATERIALS -- |t IV. 1 Thin Layers -- |t X-ray scattering from interface dislocations in highly mismatched oxide epitaxial films / |r Guinebretière, R. / Boulle, A. / Masson, O. / Dauger, A. -- |t Influence of magnetron sputtering conditions on the parameters of TiN coatings on steel substrates / |r Mirchev, R. / Antonov, V. / Iordanova, I. / Kelly, P.J. -- |t Structural and microstructural characterisation of ZrN coatings for decorative applications / |r Zanola, P. / Bontempi, E. / Gelfi, M. / Tosti, M. / Roberti, R. / Depero, L.E. -- |t Chalcogenide films on glass substrate as attenuators of X-ray radiation / |r Lukić, S.R. / Petrović, D.M. / Štrbac, G.R. / Štrbac, D.D. -- |t Effect of annealing conditions on structural transformation of ZnS thin film / |r Kryshtab, T. / Palacios Gómez, J. / Mazin, M. -- |t Electrocrystallization of Pt layers onto Au substrates; an X-ray diffraction study / |r Molina, I. Yu. / Plyasova, L.M. / Cherepanova, S.V. / Savinova, E.R. / Tsirlina, G.A. -- |t Residual stress mapping in the zirconia electrolyte layer of a high-temperature solid oxide fuel cell / |r Fischer, Werner / Blass, Günther -- |t Ultrashort period Cu/Si and Ni/C multilayers for X-ray mirrors / |r Jergel, M. / Ožvold, M. / Senderák, R. / Luby, Š. / Majková, E. -- |t IV. 2 Nanocrystalline Materials -- |t Microstructure of nanocrystalline materials studied by powder diffraction -- |t Preparation and characterization of isometric gold nanoparticles with pre-calculated size / |r Šlouf, M. / Kužel, R. / Matěj, Z. |
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| 856 | 4 | 0 | |u https://www.degruyter.com/openurl?genre=book&isbn=9783486992526 |z Texto completo |
| 880 | 0 | 0 | |6 505-00/(S |t A neutron diffraction study -- |t Characterisation of radiation-induced precipitates in reactor pressure vessel steels -- |t Structure analysis of NiZr2 in reciprocal and real space -- |t In situ high temperature XRD studies of the crystallisation of melt-spun Mg77Ni18Y5 -- |t Complex intermetallic compounds in the Mg-Ir system solved by powder diffraction -- |t IV. 4 Minerals and Inorganics -- |t IV. 4.1 Structural Changes, Non-Ambient Conditions -- |t Low temperature SR-XRPD study of åkermanite-gehlenite solid solution -- |t Study of the structural evolution and selectivity of Wyoming montmorillonite in relation with the concentration of Cu2+ and Ni2+ -- |t The interlayer structure and thermal behavior of Cu and Ni montmorillonites -- |t Structural characterisation of hightemperature K-exchanged sodalite -- |t A time-resolved X-ray powder diffraction method to trace the decomposition of PdBy solid solutions -- |t γʹ-Fe4N formation in decomposing ε-Fe3N: A powder diffraction study using synchrotron radiation -- |t X -- ray powder diffraction study of leucite crystallisation -- |t Neutron diffraction structure study of borosilicate based matrix glasses -- |t Neutron diffraction studies of temperature induced phase transitions in Rb2KFeF6 elpasolite -- |t IV. 4.2 Determination of Crystal Structure -- |t Cation distribution in Li2M(II)Sn3O8, M(II) = Mg, Co, Fe -- |t Crystal structure of the monoclinic Ba2MgSi2O7 persistent luminescence material -- |t Cation distributions in fully hydrated Sr-and Rb- bicationic zeolites: an X-ray anomalous powder diffraction study -- |t Model of structure disorder of illite: preliminary results -- |t XRD study of the stacking mode of the nacrite/alkali halides complexes -- |t Crystal structure determination and Rietveld refinement of rosasite and mcguinnessite -- |t Rietveld analysis of polytypic Zn1−xMgxSe and Zn1−x−yMgxBeySe solid solutions -- |t A proposition for the structure of ammonium hydrogen (acid) urate from uroliths -- |t X-ray powder diffraction data of synthetic ß- Tricalcium Phosphate -- |t Distribution of sodium cations and chemisorbed methyl groups in the structure of NaX and NaLSX zeolite catalysts by powder neutron diffraction and 13C NMR -- |t IV. 4.3 Determination of Magnetic Structure, Magnetic Materials -- |t Structural and magnetic study of magnetoelectric perovskite Sr2CoMoO6 -- |t Crystal structure and magnetism of Pr[Fe(CN)6]·4D2O -- |t IV. 4.4 Microstructure, Phase Analysis -- |t Microstructure of crystalline phases in electrotechnical porcelains -- |t Micro(nano)structure of the glacial state in triphenyl phosphite (TPP) -- |t Correlation between texture and tabletting properties of some pharmaceutical tablets -- |t Incrustation of precious stones in dental apatite -- |t Microstructural analysis of ZnO from different aqueous synthesis routes -- |t The effect of Al and Gd doping on the structure, microstructure and thermal expansion of gallium nitride (GaN) -- |t Quantitative phase analysis of ordinary Portland cements using synchrotron radiation powder diffraction -- |t IV. 5 Organic Materials -- |t Ab initio structure determination of two anhydrous forms of α-lactose by powder X-ray diffraction -- |t Structure determination of 1-pentanol (C5H12O) at 183 K -- |t Crystallographic texture changes of wood due to air parameter variations -- |t Poly(ethylene glycol) interactions with proteins -- |t Author Index |
| 880 | 0 | 0 | |6 505-01/(S |t Frontmatter -- |t Preface: Condensation of Scientific Knowledge on Powder Diffraction -- |t Editorial Notes -- |t European Powder Diffraction Conference Award -- |t Table of Contents -- |t I. METHOD DEVELOPMENT AND APPLICATION -- |t I.1 Determination of Crystal Structure -- |t Protein polycrystallography -- |t Using the parallel tempering algorithm to overcome complex problems in structure determination of inorganic materials with laboratory X-rays -- |t Molecular crystal structures from powder X-ray diffraction techniques -- |t On the uncertainty of lattice parameters refined from neutron diffraction data -- |t I.2 Qualitative and Quantitative Phase Analysis -- |t Application of the Rietveld method to the severely superimposed diffraction patterns of technical products containing a large number of solid solution phases -- |t Application of X-ray diffraction in forensic science -- |t I.3 Analysis of Microstructure and Macrostress -- |t I.3.1 Residual Stresses -- |t Diffraction stress analysis of grain interaction in polycrystalline materials -- |t Accurate absolute peak positions for multiple {hkl} residual stress analysis by means of misalignment corrections -- |t Diffraction stress analysis of strongly fibre-textured gold layers -- |t Residual stress measurement of gold artefacts by Debye ring analysis -- |t X-ray residual stress measurement in titanium nitride thin films -- |t I.3.2 Line Broadening Analysis -- |t Dislocation line broadening -- |t Considerations concerning Wilkens' theory of dislocation line-broadening -- |t Momentum method applied to evaluation of size and strain in ball-milled iron -- |t Microstructure of severely deformed metals from X-ray line profile analysis -- |t Burgers Vector Populations in hot rolled titanium determined by X-ray Peak Profile Analysis -- |t Spatial fluctuations of the microstructure during deformation of Cu single crystals -- |t Analysis of polydisperse ball-milled fluorite powders using a full pattern technique -- |t Anisotropic microstrain broadening due to compositional inhomogeneities and its parametrisation -- |t X-ray diffraction from epitaxial thin films: an analytical expression of the line profiles accounting for microstructure -- |t Microstructure of post-deformed ECAPTi investigated by Multiple X-Ray Line Profile Analysis -- |t The Dislocation-Structure and Crystallite- Size in Forsterite (Olivine) Deformed at 1400 °C by 11 GPa -- |t Diffuse X-ray scattering from GaN/SiC (0001) thin films -- |t Test of applicability of some powder diffraction tools to nanocrystals -- |t Influence of coherent connection of crystalline blocks on the diffraction pattern of nanostructured materials -- |t I.4 Texture -- |t Automated Crystal Orientation Measurement by backscatter Kikuchi diffraction -- |t A simple technique for correcting diffraction intensities for the effects of preferred orientation in calcite samples -- |t Influence of extinction phenomenon on determination of the orientation distribution function -- |t II. INSTRUMENTAL -- |t First test measurements at the new structure powder diffractometer (SPODI) at the FRM-II -- |t EXED -- the new Extreme Environment Diffractometer at the Hahn-Meitner-Institut Berlin -- |t R2D2: a new neutron powder diffractometer at NFL -- |t Bent perfect crystal monochromator at the monochromatic focusing condition -- |t Multiple-reflection neutron bent-perfect-crystal (BPC) monochromator -- |t Wavelength calibration in conventional SANS setup with a mechanical velocity selector -- |t Neutron RTOF diffractometer FSD for residual stress investigation -- |t III. SOFTWARE DEVELOPMENT -- |t Indexing with the successive dichotomy method, DICVOL04 -- |t Powder3D: An easy to use program for data reduction and graphical presentation of large numbers of powder diffraction patterns -- |t BRASS, the Bremen Rietveld analysis and structure suite -- |t FAULTS, a new program for refinement of powder diffraction patterns from layered structures -- |t PM2K: a flexible program implementing Whole Powder Pattern Modelling -- |t Calculating the peak shape of axially focussing powder diffractometers -- |t IV. MATERIALS -- |t IV. 1 Thin Layers -- |t X-ray scattering from interface dislocations in highly mismatched oxide epitaxial films -- |t Influence of magnetron sputtering conditions on the parameters of TiN coatings on steel substrates -- |t Structural and microstructural characterisation of ZrN coatings for decorative applications -- |t Chalcogenide films on glass substrate as attenuators of X-ray radiation -- |t Effect of annealing conditions on structural transformation of ZnS thin film -- |t Electrocrystallization of Pt layers onto Au substrates; an X-ray diffraction study -- |t Residual stress mapping in the zirconia electrolyte layer of a high-temperature solid oxide fuel cell -- |t Ultrashort period Cu/Si and Ni/C multilayers for X-ray mirrors -- |t IV. 2 Nanocrystalline Materials -- |t Microstructure of nanocrystalline materials studied by powder diffraction -- |t Preparation and characterization of isometric gold nanoparticles with pre-calculated size -- |t Bulk characterization of multiwall carbon nanotubes -- |t Neutron diffraction studies of the atomic vibrations of bulk and surface atoms of nanocrystalline SiC -- |t Phase transition in nanocrystalline ZnO -- |t IV. 3 Metals and Alloys -- |t Study of martensitic transformation in fatigued stainless steel by neutron diffraction stress analysis -- |t The evaluation of the kinetics of ordering processes in Ni1+δSn (δ = 0.35, 0.50) by X-ray powder diffraction -- |t In situ neutron diffraction study of the low cycle fatigue of the α−γ duplex stainless steel -- |t SANS investigation of precipitate microstructure in nickel-base superalloys Waspaloy and DT750 -- |t Diffraction analysis of iron materials after surface machining -- |t Non-destructive phase analysis and residual stresses measurement using grazing angle X-ray diffraction geometry -- |t Thermal stability of the microstructure of severely deformed copper -- |t Archaeometric study of Dutch Tin-Lead spoon fragments from Amsterdam: 1500-1775 AD. |
| 938 | |a De Gruyter |b DEGR |n 9783486992526 | ||
| 994 | |a 92 |b IZTAP | ||