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Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials : Garmisch-Partenkirchen, October 7-9, 2007.
Zeitschrift für Kristallographie. Supplement Volume 27 presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Dif...
| Clasificación: | Libro Electrónico |
|---|---|
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Berlin ; Boston :
Oldenbourg Wissenschaftsverlag,
[2015]
|
| Colección: | Zeitschrift für Kristallographie / Supplemente ;
27 |
| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Frontmatter
- PREFACE
- Table of Contents
- PLANAR FAULTING
- Diffraction analysis of layer disorder
- Peculiarities of the X-ray diffraction of oxygen-deficient perovskite-related materials with partial vacancy ordering
- NANOCRYSTALLINE MATERIALS
- Interference phenomena in nanocrystalline materials and their application in the microstructure analysis
- Optimisation of coherent X-ray diffraction imaging at ultrabright synchrotron sources
- Capacitor discharge sintering of nanocrystalline copper
- Microstructure study on BN nanocomposites using XRD and HRTEM
- PLASTIC DEFORMATION
- Impact of dislocation cell elastic strain variations on line profiles from deformed copper
- Determination of stored elastic energy in plastically deformed copper
- Structural studies of submicrocrystalline copper and copper composites by different methods
- Grain stresses and elastic energy in ferritic steel under uniaxial load
- Stress and hardness in surface layers of shot-peened steels
- LINE BROADENING ANALYSIS; DETERMINATION OF CRYSTALLITE SIZE AND MICROSTRAIN
- The "state of the art" of the diffraction analysis of crystallite size and lattice strain
- Recent advancements in Whole Powder Pattern Modelling
- On the simulation of the anisotropic peak broadening in powder diffraction
- XRD and FTIR characterization of nanocrystalline YVO4: Eu derived by coprecipitation process
- Cumulants and moments in the line profile analysis
- X-ray line-broadening analysis of dislocations in a single crystal of Zr
- XRD line profile analysis of calcite powders produced by high energy milling
- Refining real structure parameters of disordered layer structures within the Rietveld method
- Microstructural characterisation of Cr-Al-N nanocomposites deposited by cathodic arc evaporation
- MATERIALS MICROSTRUCTURE
- Characterization of hot wall grown N-9-anthracenylidene-1-anthramine films
- Structural and optical properties of AgInSe2 films
- In situ synchrotron X-ray diffraction study of formation mechanism of Rh0.33Re0.67 nanoalloy powder upon thermal decomposition of complex precursor
- Crystallite size and micro- and macrostrain changes during layer exchange upon annealing amorphous/crystalline aluminium
- Structural state of Eu2(MoO4)3 single crystal after different thermobaric treatments
- Anomalous structure of nanocrystallites of rare-earth compounds produced by sol-gel methods
- Refinement of extinction-affected X-ray reflection profile of textures
- STRESSES AND STRAINS
- Diffraction analysis of elastic strains in micro- and nanostructures
- Determination of residual stress at weld interruptions by neutron diffraction
- Residual stress and elastic anisotropy in the Ti-Al-(Si- )N and Cr-Al-(Si- )N nanocomposites deposited by cathodic arc evaporation
- In-situ X-ray diffraction investigations of thin films: Determination of thermoelastic constants
- THIN FILMS
- Profiling of fibre texture gradients in thin films by anomalous X-ray diffraction
- X-ray residual stress analysis in CVD multilayer systems: Influence of steep gradients on the line profile shape and
- symmetry
- Magnetron deposited TiO2 thin films
- crystallization and temperature dependence of microstructure and phase composition
- Influence of reactive plasmas on thin nickel films
- Author Index