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Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials : Garmisch-Partenkirchen, October 7-9, 2007.
Zeitschrift für Kristallographie. Supplement Volume 27 presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Dif...
| Clasificación: | Libro Electrónico |
|---|---|
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Berlin ; Boston :
Oldenbourg Wissenschaftsverlag,
[2015]
|
| Colección: | Zeitschrift für Kristallographie / Supplemente ;
27 |
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 264 | 1 | |a Berlin ; |a Boston : |b Oldenbourg Wissenschaftsverlag, |c [2015] | |
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| 490 | 0 | |a Zeitschrift für Kristallographie / Supplemente ; |v 27 | |
| 505 | 0 | 0 | |t Frontmatter -- |t PREFACE -- |t Table of Contents -- |t PLANAR FAULTING -- |t Diffraction analysis of layer disorder -- |t Peculiarities of the X-ray diffraction of oxygen-deficient perovskite-related materials with partial vacancy ordering -- |t NANOCRYSTALLINE MATERIALS -- |t Interference phenomena in nanocrystalline materials and their application in the microstructure analysis -- |t Optimisation of coherent X-ray diffraction imaging at ultrabright synchrotron sources -- |t Capacitor discharge sintering of nanocrystalline copper -- |t Microstructure study on BN nanocomposites using XRD and HRTEM -- |t PLASTIC DEFORMATION -- |t Impact of dislocation cell elastic strain variations on line profiles from deformed copper -- |t Determination of stored elastic energy in plastically deformed copper -- |t Structural studies of submicrocrystalline copper and copper composites by different methods -- |t Grain stresses and elastic energy in ferritic steel under uniaxial load -- |t Stress and hardness in surface layers of shot-peened steels -- |t LINE BROADENING ANALYSIS; DETERMINATION OF CRYSTALLITE SIZE AND MICROSTRAIN -- |t The "state of the art" of the diffraction analysis of crystallite size and lattice strain -- |t Recent advancements in Whole Powder Pattern Modelling -- |t On the simulation of the anisotropic peak broadening in powder diffraction -- |t XRD and FTIR characterization of nanocrystalline YVO4: Eu derived by coprecipitation process -- |t Cumulants and moments in the line profile analysis -- |t X-ray line-broadening analysis of dislocations in a single crystal of Zr -- |t XRD line profile analysis of calcite powders produced by high energy milling -- |t Refining real structure parameters of disordered layer structures within the Rietveld method -- |t Microstructural characterisation of Cr-Al-N nanocomposites deposited by cathodic arc evaporation -- |t MATERIALS MICROSTRUCTURE -- |t Characterization of hot wall grown N-9-anthracenylidene-1-anthramine films -- |t Structural and optical properties of AgInSe2 films -- |t In situ synchrotron X-ray diffraction study of formation mechanism of Rh0.33Re0.67 nanoalloy powder upon thermal decomposition of complex precursor -- |t Crystallite size and micro- and macrostrain changes during layer exchange upon annealing amorphous/crystalline aluminium -- |t Structural state of Eu2(MoO4)3 single crystal after different thermobaric treatments -- |t Anomalous structure of nanocrystallites of rare-earth compounds produced by sol-gel methods -- |t Refinement of extinction-affected X-ray reflection profile of textures -- |t STRESSES AND STRAINS -- |t Diffraction analysis of elastic strains in micro- and nanostructures -- |t Determination of residual stress at weld interruptions by neutron diffraction -- |t Residual stress and elastic anisotropy in the Ti-Al-(Si- )N and Cr-Al-(Si- )N nanocomposites deposited by cathodic arc evaporation -- |t In-situ X-ray diffraction investigations of thin films: Determination of thermoelastic constants -- |t THIN FILMS -- |t Profiling of fibre texture gradients in thin films by anomalous X-ray diffraction -- |t X-ray residual stress analysis in CVD multilayer systems: Influence of steep gradients on the line profile shape and -- symmetry -- |t Magnetron deposited TiO2 thin films -- crystallization and temperature dependence of microstructure and phase composition -- |t Influence of reactive plasmas on thin nickel films -- |t Author Index |
| 588 | 0 | |a Online resource; title from PDF title page (publisher's Web site, viewed Dec. 15, 2016). | |
| 520 | |a Zeitschrift für Kristallographie. Supplement Volume 27 presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Diffraction/Microstructure Modeling Supplement Series of Zeitschrift für Kristallographie publishes Proceedings and Abstracts of international conferences on the interdisciplinary field of crystallography. | ||
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