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Probing Crystal Plasticity at the Nanoscales Synchrotron X-ray Microdiffraction /

This Brief highlights the search for strain gradients and geometrically necessary dislocations as a possible source of strength for two cases of deformation of materials at small scales: nanoindented single crystal copper and uniaxially compressed single crystal submicron gold pillars. When crystall...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Budiman, Arief Suriadi (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Singapore : Springer Nature Singapore : Imprint: Springer, 2015.
Edición:1st ed. 2015.
Colección:SpringerBriefs in Applied Sciences and Technology,
Temas:
Acceso en línea:Texto Completo

MARC

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245 1 0 |a Probing Crystal Plasticity at the Nanoscales  |h [electronic resource] :  |b Synchrotron X-ray Microdiffraction /  |c by Arief Suriadi Budiman. 
250 |a 1st ed. 2015. 
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300 |a IX, 118 p. 64 illus., 52 illus. in color.  |b online resource. 
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505 0 |a From the Contents: Introduction -- Synchrotron White-beam X-ray Microdiffraction at the Advanced Light Source, Berkeley Lab -- Electromigration-induced Plasticity in Cu Interconnects: The Length Scale Dependence. 
520 |a This Brief highlights the search for strain gradients and geometrically necessary dislocations as a possible source of strength for two cases of deformation of materials at small scales: nanoindented single crystal copper and uniaxially compressed single crystal submicron gold pillars. When crystalline materials are mechanically deformed in small volumes, higher stresses are needed for plastic flow. This has been called the "Smaller is Stronger" phenomenon and has been widely observed. studies suggest that plasticity in one case is indeed controlled by the GNDs (strain gradient hardening), whereas in the other, plasticity is not controlled by strain gradients or sub-structure hardening, but rather by dislocation source starvation, wherein smaller volumes are stronger because fewer sources of dislocations are available (dislocation starvation hardening). 
650 0 |a Materials-Analysis. 
650 0 |a Microtechnology. 
650 0 |a Microelectromechanical systems. 
650 0 |a Crystallography. 
650 0 |a Spectrum analysis. 
650 0 |a Nanotechnology. 
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650 2 4 |a Microsystems and MEMS. 
650 2 4 |a Crystallography and Scattering Methods. 
650 2 4 |a Spectroscopy. 
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