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CMOS RF Circuit Design for Reliability and Variability

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typic...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Yuan, Jiann-Shiun (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Singapore : Springer Nature Singapore : Imprint: Springer, 2016.
Edición:1st ed. 2016.
Colección:SpringerBriefs in Reliability,
Temas:
Acceso en línea:Texto Completo

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