Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors /

Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus important, strongly depending on the nature and density of charge traps pres...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Im, Seongil (Autor), Chang, Youn-Gyoung (Autor), Kim, Jae Hoon (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2013.
Edición:1st ed. 2013.
Colección:SpringerBriefs in Physics,
Temas:
Electronic circuits.
Condensed matter.
Lasers.
Measurement.
Measuring instruments.
Electronic Circuits and Systems.
Condensed Matter Physics.
Laser.
Measurement Science and Instrumentation.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Chapter 1 Device Stability and Photo-Excited Charge-Collection Spectroscopy
  • Chapter 2 Instrumentations for PECCS
  • Chapter 3 PECCS measurements in Organic FETs
  • Chapter 4 PECCS measurements in Oxide FETs
  • Chapter 5 PECCS measurements in Nanostructure FETs
  • Chapter 6 Summary and limiting factors of PECCS.

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