Protecting Chips Against Hold Time Violations Due to Variability

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The consequences of variability to several aspects of circuit design, such as logic gates, st...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Neuberger, Gustavo (Autor), Wirth, Gilson (Autor), Reis, Ricardo (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2014.
Edición:1st ed. 2014.
Temas:
Electronic circuits.
Microprocessors.
Computer architecture.
Electronic Circuits and Systems.
Processor Architectures.
Acceso en línea:Texto Completo

MARC

LEADER 00000nam a22000005i 4500
001 978-94-007-2427-3
003 DE-He213
005 20220116221421.0
007 cr nn 008mamaa
008 131001s2014 ne | s |||| 0|eng d
020 |a 9789400724273  |9 978-94-007-2427-3 
024 7 |a 10.1007/978-94-007-2427-3  |2 doi 
050 4 |a TK7867-7867.5 
072 7 |a TJFC  |2 bicssc 
072 7 |a TEC008010  |2 bisacsh 
072 7 |a TJFC  |2 thema 
082 0 4 |a 621.3815  |2 23 
100 1 |a Neuberger, Gustavo.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
245 1 0 |a Protecting Chips Against Hold Time Violations Due to Variability  |h [electronic resource] /  |c by Gustavo Neuberger, Gilson Wirth, Ricardo Reis. 
250 |a 1st ed. 2014. 
264 1 |a Dordrecht :  |b Springer Netherlands :  |b Imprint: Springer,  |c 2014. 
300 |a XI, 107 p. 76 illus., 51 illus. in color.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
505 0 |a Introduction, Process Variations and Flip-Flops -- Process Variability -- Flip-Flops and Hold Time Violations -- Circuits Under Test -- Measurement Circuits -- Experimental Results -- Systematic and Random Variablility -- Normality Tests -- Probability of Hold Time Violations -- Protecting Circuits Against Hold Time Violations -- Padding Efficiency Of the Proposed Padding Algorithm -- Final Remarks. 
520 |a This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The consequences of variability to several aspects of circuit design, such as logic gates, storage elements, clock distribution, and any other that can be affected by process variations are discussed, with a key focus on storage elements.  The authors present a statistical analysis of the critical clock skew in several test paths, due to process variability in 130nm and 90nm CMOS technology. To facilitate an on-wafer test, a measurement circuit with a precision compatible to the speed of the technology is described.  ·         Provides a comprehensive review of various reliability mechanisms; ·         Describes practical modeling and characterization techniques for reliability ·         Includes thorough presentation of robust design techniques for major VLSI design units ·         Promotes physical understanding with first-principle simulations. 
650 0 |a Electronic circuits. 
650 0 |a Microprocessors. 
650 0 |a Computer architecture. 
650 1 4 |a Electronic Circuits and Systems. 
650 2 4 |a Processor Architectures. 
700 1 |a Wirth, Gilson.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
700 1 |a Reis, Ricardo.  |e author.  |0 (orcid)0000-0001-5781-5858  |1 https://orcid.org/0000-0001-5781-5858  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer Nature eBook 
776 0 8 |i Printed edition:  |z 9789400724266 
776 0 8 |i Printed edition:  |z 9789400724280 
776 0 8 |i Printed edition:  |z 9789401777940 
856 4 0 |u https://doi.uam.elogim.com/10.1007/978-94-007-2427-3  |z Texto Completo 
912 |a ZDB-2-ENG 
912 |a ZDB-2-SXE 
950 |a Engineering (SpringerNature-11647) 
950 |a Engineering (R0) (SpringerNature-43712) 

Ejemplares similares