Design, Analysis and Test of Logic Circuits Under Uncertainty

Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits.  To improve future semiconductor designs,...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Krishnaswamy, Smita (Autor), Markov, Igor L. (Autor), Hayes, John P. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2013.
Edición:1st ed. 2013.
Colección:Lecture Notes in Electrical Engineering, 115
Temas:
Electronic circuits.
Computer arithmetic and logic units.
Computers.
Logic design.
Computer science-Mathematics.
Electronic Circuits and Systems.
Arithmetic and Logic Structures.
Computer Hardware.
Hardware Performance and Reliability.
Logic Design.
Symbolic and Algebraic Manipulation.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Introduction
  • Probabilistic Transfer Matrices
  • Computing with Probabilistic Transfer Matrices
  • Testing Logic Circuits for Probabilistic Faults
  • Signtaure-based Reliability Analysis
  • Design for Robustness
  • Summary and Extensions.

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