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Design, Analysis and Test of Logic Circuits Under Uncertainty
Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits. To improve future semiconductor designs,...
| Clasificación: | Libro Electrónico |
|---|---|
| Autores principales: | , , |
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Dordrecht :
Springer Netherlands : Imprint: Springer,
2013.
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| Edición: | 1st ed. 2013. |
| Colección: | Lecture Notes in Electrical Engineering,
115 |
| Temas: | |
| Acceso en línea: | Texto Completo |