Robust Computing with Nano-scale Devices Progresses and Challenges /

Although complementary metal-oxide semiconductor (CMOS) technology will continue dominating the digital electronic circuits for the next 10-15 years, a number of grand challenges have emerged as the transistor size scales down. The rising costs of semiconductor mask and fabrication pose economic bar...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Huang, Chao (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2010.
Edición:1st ed. 2010.
Colección:Lecture Notes in Electrical Engineering, 58
Temas:
Electronic circuits.
Nanotechnology.
Microprocessors.
Computer architecture.
Artificial intelligence.
Electronic Circuits and Systems.
Processor Architectures.
Artificial Intelligence.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Fault Tolerant Nanocomputing
  • Transistor-Level Based Defect-Tolerance for Reliable Nanoelectronics
  • Fault-Tolerant Design for Nanowire-Based Programmable Logic Arrays
  • Built-In Self-Test and Defect Tolerance for Molecular Electronics-Based NanoFabrics
  • The Prospect and Challenges of CNFET Based Circuits: A Physical Insight
  • Computing with Nanowires: A Self Assembled Neuromorphic Architecture
  • Computational Opportunities and CAD for Nanotechnologies.

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