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Efficient Test Methodologies for High-Speed Serial Links

With the increasing demand for higher data bandwidth, communication systems' data rates have reached the multi-gigahertz range and even beyond. Advances in semiconductor technologies have accelerated the adoption of high-speed serial interfaces, such as PCI-Express, Serial-ATA, and XAUI, in ord...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Hong, Dongwoo (Autor), Cheng, Kwang-Ting (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2010.
Edición:1st ed. 2010.
Colección:Lecture Notes in Electrical Engineering, 51
Temas:
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • An Efficient Jitter Measurement Technique
  • BER Estimation for Linear Clock and Data Recovery Circuit
  • BER Estimation for Non-linear Clock and Data Recovery Circuit
  • Gaps in Timing Margining Test
  • An Accurate Jitter Estimation Technique
  • A Two-Tone Test Method for Continuous-Time Adaptive Equalizers
  • Conclusions.