Efficient Test Methodologies for High-Speed Serial Links
With the increasing demand for higher data bandwidth, communication systems' data rates have reached the multi-gigahertz range and even beyond. Advances in semiconductor technologies have accelerated the adoption of high-speed serial interfaces, such as PCI-Express, Serial-ATA, and XAUI, in ord...
Clasificación: | Libro Electrónico |
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Autores principales: | , |
Autor Corporativo: | |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Dordrecht :
Springer Netherlands : Imprint: Springer,
2010.
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Edición: | 1st ed. 2010. |
Colección: | Lecture Notes in Electrical Engineering,
51 |
Temas: | |
Acceso en línea: | Texto Completo |
Tabla de Contenidos:
- An Efficient Jitter Measurement Technique
- BER Estimation for Linear Clock and Data Recovery Circuit
- BER Estimation for Non-linear Clock and Data Recovery Circuit
- Gaps in Timing Margining Test
- An Accurate Jitter Estimation Technique
- A Two-Tone Test Method for Continuous-Time Adaptive Equalizers
- Conclusions.