Test Pattern Generation using Boolean Proof Engines
After producing a chip, the functional correctness of the integrated circuit has to be checked. Otherwise products with malfunctions would be delivered to customers, which is not acceptable for any company. Many algorithms for "Automatic Test Pattern Generation" (ATPG) have been proposed i...
Clasificación: | Libro Electrónico |
---|---|
Autores principales: | Drechsler, Rolf (Autor), Eggersglüß, Stephan (Autor), Fey, Görschwin (Autor), Tille, Daniel (Autor) |
Autor Corporativo: | SpringerLink (Online service) |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Dordrecht :
Springer Netherlands : Imprint: Springer,
2009.
|
Edición: | 1st ed. 2009. |
Temas: | |
Acceso en línea: | Texto Completo |
Ejemplares similares
-
High Quality Test Pattern Generation and Boolean Satisfiability
por: Eggersglüß, Stephan, et al.
Publicado: (2012) -
Robustness and Usability in Modern Design Flows
por: Fey, Görschwin, et al.
Publicado: (2008) -
Advanced BDD Optimization
por: Ebendt, Rudiger, et al.
Publicado: (2005) -
Reversible and Quantum Circuits Optimization and Complexity Analysis /
por: Abdessaied, Nabila, et al.
Publicado: (2016) -
Quadrature Frequency Generation for Wideband Wireless Applications
por: Elbadry, Mohammad, et al.
Publicado: (2015)