Defects and Impurities in Silicon Materials An Introduction to Atomic-Level Silicon Engineering /

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This book emphasizes the importance of the fascinating atomistic insights into the defects and the impurities as well as the dynamic behaviors in silicon materials, which have become more directly accessible over the past 20 years. Such progress has been made possible by newly developed experimental...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Yoshida, Yutaka (Editor ), Langouche, Guido (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Tokyo : Springer Japan : Imprint: Springer, 2015.
Edición:1st ed. 2015.
Colección:Lecture Notes in Physics, 916
Temas:
Semiconductors.
Nanotechnology.
Materials.
Microtechnology.
Microelectromechanical systems.
Condensed matter.
Nanoscience.
Materials Engineering.
Microsystems and MEMS.
Condensed Matter Physics.
Nanophysics.
Acceso en línea:Texto Completo
Descripción
Sumario:This book emphasizes the importance of the fascinating atomistic insights into the defects and the impurities as well as the dynamic behaviors in silicon materials, which have become more directly accessible over the past 20 years. Such progress has been made possible by newly developed experimental methods, first principle theories, and computer simulation techniques. The book is aimed at young researchers, scientists, and technicians in related industries. The main purposes are to provide readers with 1) the basic physics behind defects in silicon materials, 2) the atomistic modeling as well as the characterization techniques related to defects and impurities in silicon materials, and 3) an overview of the wide range of the research fields involved.
Descripción Física:XV, 487 p. 292 illus., 180 illus. in color. online resource.
ISBN:9784431558002
ISSN:1616-6361 ;

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