Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...
Clasificación: | Libro Electrónico |
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Autor principal: | Voigtländer, Bert (Autor) |
Autor Corporativo: | SpringerLink (Online service) |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2015.
|
Edición: | 1st ed. 2015. |
Colección: | NanoScience and Technology,
|
Temas: | |
Acceso en línea: | Texto Completo |
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