Surface Science Tools for Nanomaterials Characterization

Fourth volume of a 40volume series on nano science and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered an...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Kumar, Challa S.S.R (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2015.
Edición:1st ed. 2015.
Temas:
Nanochemistry.
Nanotechnology.
Nanoscience.
Nanophysics.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Higher Resolution Scanning Probe Methods for Magnetic Imaging
  • The Synchrotron Based VUV Resonant Photoemission for Characterisation of Nanomaterials
  • SPM for Characterization of PbSe Nanocrystals.-Scanning Probe Microscopy for Nanolithography
  • Kelvin Probe Force Microscopy.-Synchrotron Radiation X-ray Photoelectron Spectroscopy
  • Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM)
  • Band Bending at Metal-Semiconductor and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy
  • Magnetic Force Microscopy
  • High Resolution STM Imaging.-Numerical Simulations on Nanotips for FIM and FEM .-ARPES on Organic Semiconductor Single Crystals Crystalline Films
  • FIM-Characterized Tips for SPM
  • Scanning Conductive Torsion Mode Microscopy
  • Scanning Probe Acceleration Microscopy (SPAM)
  • Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Magnetic Nanostructures
  • Field Ion Microscopy (FIM)
  • Non-Contact Atomic Force Microscopy for Characterization of Nanostructures and Beyond.

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