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00000nam a22000005i 4500 |
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DE-He213 |
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20220112172446.0 |
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cr nn 008mamaa |
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150310s2015 gw | s |||| 0|eng d |
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|a 9783662445518
|9 978-3-662-44551-8
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|a 10.1007/978-3-662-44551-8
|2 doi
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|a QD478
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|a TBN
|2 bicssc
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|a TGM
|2 bicssc
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|a SCI050000
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|a TBN
|2 thema
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|a 541.2
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|a Surface Science Tools for Nanomaterials Characterization
|h [electronic resource] /
|c edited by Challa S.S.R. Kumar.
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|a 1st ed. 2015.
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|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg :
|b Imprint: Springer,
|c 2015.
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|a X, 652 p. 293 illus., 221 illus. in color.
|b online resource.
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
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|a text file
|b PDF
|2 rda
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|a Higher Resolution Scanning Probe Methods for Magnetic Imaging -- The Synchrotron Based VUV Resonant Photoemission for Characterisation of Nanomaterials -- SPM for Characterization of PbSe Nanocrystals.-Scanning Probe Microscopy for Nanolithography -- Kelvin Probe Force Microscopy.-Synchrotron Radiation X-ray Photoelectron Spectroscopy -- Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM) -- Band Bending at Metal-Semiconductor and Metal-Ferroelectric Interfaces Investigated by Photoelectron Spectroscopy -- Magnetic Force Microscopy -- High Resolution STM Imaging.-Numerical Simulations on Nanotips for FIM and FEM .-ARPES on Organic Semiconductor Single Crystals Crystalline Films -- FIM-Characterized Tips for SPM -- Scanning Conductive Torsion Mode Microscopy -- Scanning Probe Acceleration Microscopy (SPAM) -- Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Magnetic Nanostructures -- Field Ion Microscopy (FIM) -- Non-Contact Atomic Force Microscopy for Characterization of Nanostructures and Beyond.
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|a Fourth volume of a 40volume series on nano science and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Surface Science Tools for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
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|a Nanochemistry.
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|a Nanotechnology.
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|a Nanoscience.
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|a Nanochemistry.
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|a Nanotechnology.
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|a Nanophysics.
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|a Kumar, Challa S.S.R.
|e editor.
|4 edt
|4 http://id.loc.gov/vocabulary/relators/edt
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|a SpringerLink (Online service)
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|t Springer Nature eBook
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|i Printed edition:
|z 9783662445501
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|i Printed edition:
|z 9783662445525
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|i Printed edition:
|z 9783662515471
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|u https://doi.uam.elogim.com/10.1007/978-3-662-44551-8
|z Texto Completo
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|a ZDB-2-CMS
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|a ZDB-2-SXC
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|a Chemistry and Materials Science (SpringerNature-11644)
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|a Chemistry and Material Science (R0) (SpringerNature-43709)
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